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Measurement of Young's Modulus and Poisson's Ratio of Free-Standing Ag/Cu Multilayered Thin Films

Published online by Cambridge University Press:  15 February 2011

Haibo Huang  and
Frans Spaepen
Haibo Huang
Affiliation:
Division of Applied Sciences, Harvard University, Cambridge, MA 02138
Frans Spaepen
Affiliation:
Division of Applied Sciences, Harvard University, Cambridge, MA 02138
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Abstract

Strain measurement by laser diffraction was used in tensile testing of free-standing Ag/Cu multilayered thin films with repeat lengths between 3 nm and 3 μm. The mean value, for all the films, of the Young modulus was 83.1± 1.2 GPa, and of the Poisson ratio was 0.377±0.015. No variation with bilayer repeat length, and hence no “supermodulus” effect, was observed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 405: Symposium K – Surface/Interface and Stress Effects in Electronic Materials Nanostructures , 1995 , 501
Copyright
Copyright © Materials Research Society 1996

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