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Magnetic Resonance and Electronic Spectroscopy of Defects in M2P2S6 Layered Compounds

Published online by Cambridge University Press:  28 February 2011

E. Lifshitz  and
A. H. Francis
E. Lifshitz
Affiliation:
The University of Michigan, Dept. of Chemistry, Michigan, Ann Arbor, MI 48109–1055
A. H. Francis
Affiliation:
The University of Michigan, Dept. of Chemistry, Michigan, Ann Arbor, MI 48109–1055
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Abstract

The lamellar transition metal chalcogeno-phosphates (M2P2S6) form an important family of two-dimensional semiconducting materials. They exhibit highly two-dimensional physical properties and an unusual solid-state chemistry that makes them of interest for new technologies. The lamellar structure is formed by stacking layers along a unique crystallographic axis. Under appropriate conditions, guest molecules can diffuse into the space between the layers to form intercalation compounds. The process of intercalation often creates defects and impurity sites resulting in a dramatic modification of the chemical and physical properties of the host lattice.

Several experimental methods have been utilized to characterize the defect structure produced by intercalation: ESR spectroscopy has revealed the equilibrium structure of intercalated molecules. Photoluminescence studies have shown a broadening of the conduction band due to the insertion of defect levels near the band edges. Optically detected magnetic resonance measurements demonstrated the presence of a strongly coupled donor-acceptor pair in the intercalated lattice.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 138: Symposium Q – Characterization of the Structure and Chemistry of Defects in Materials , 1988 , 255
Copyright
Copyright © Materials Research Society 1989

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