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Long-Term Reliability of Silica-Based Planar Lightwave Circuit Devices

Published online by Cambridge University Press:  10 February 2011

H. Hanafusa ,
S. Sumida  and
N. Takato
H. Hanafusa
Affiliation:
NTT Opto-electronics Laboratories, Tokai, Ibaraki, 319–1193Japan, sumida@iba.iecl.ntt.co.jp
S. Sumida
Affiliation:
NTT Opto-electronics Laboratories, Tokai, Ibaraki, 319–1193Japan, sumida@iba.iecl.ntt.co.jp
N. Takato
Affiliation:
NTT Opto-electronics Laboratories, Tokai, Ibaraki, 319–1193Japan, sumida@iba.iecl.ntt.co.jp
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Abstract

We describe the results of accelerated lifetests performed on silica-based planar lightwave circuit (PLC) devices. Specifically, we tested PLC splitter modules in damp heat environments with different temperatures and humidities. The time-to-failure data of the splitter samples were analyzed by using the Weibull distribution, and the shape parameter was derived as 1.77. Moreover, the temperature and humidity dependence of the median life e was analyzed by using the equation

and the coefficients E and n were determined to be 1.49 eV and 3.70, respectively. The thirtyyear hazard rate is estimated to be less than 40 FIT for PLC splitter modules operating at 60°C/ 40% RH.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 531: Symposium DD – Reliabilty of Photonics Materials & Structures , 1998 , 349
Copyright
Copyright © Materials Research Society 1998

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