Hostname: page-component-8448b6f56d-m8qmq Total loading time: 0 Render date: 2024-04-18T10:04:04.357Z Has data issue: false hasContentIssue false

Liquid Phase Homoepitaxial Growth of 4H-SiC Crystals and Fabrication Techniques of Bluish-Purple Light-Emitting Diodes

Published online by Cambridge University Press:  26 February 2011

Y. Ueda
Affiliation:
Semiconductor Research Center, Sanyo Electric Co., Ltd, 1-18-13 Hashiridani, Hirakata, Osaka 573 Japan
T. Nakata
Affiliation:
Semiconductor Research Center, Sanyo Electric Co., Ltd, 1-18-13 Hashiridani, Hirakata, Osaka 573 Japan
K. Koga
Affiliation:
Semiconductor Research Center, Sanyo Electric Co., Ltd, 1-18-13 Hashiridani, Hirakata, Osaka 573 Japan
Y. Matsushita
Affiliation:
Semiconductor Research Center, Sanyo Electric Co., Ltd, 1-18-13 Hashiridani, Hirakata, Osaka 573 Japan
Y. Fujikawa
Affiliation:
Semiconductor Research Center, Sanyo Electric Co., Ltd, 1-18-13 Hashiridani, Hirakata, Osaka 573 Japan
T. Uetani
Affiliation:
Semiconductor Research Center, Sanyo Electric Co., Ltd, 1-18-13 Hashiridani, Hirakata, Osaka 573 Japan
T. Yamaguchi
Affiliation:
Semiconductor Research Center, Sanyo Electric Co., Ltd, 1-18-13 Hashiridani, Hirakata, Osaka 573 Japan
T. Niina
Affiliation:
Semiconductor Research Center, Sanyo Electric Co., Ltd, 1-18-13 Hashiridani, Hirakata, Osaka 573 Japan
Get access

Abstract

4H-SiC single crystals have been fabricated on the seeds of 6H-type crystals by the vacuum-sublimation (modified Lely) method at a temperature of 2400 °C and under a pressure of 2–60 mbar in an argon atmosphere. Liquid phase epitaxy was attempted by using a dipping method with a 4H-SiC off-orientation substrate whose {0001} C-face varied toward the <1120> direction by 5 degrees. The polytype of the grown crystals was found to be the 4H-type through measurements of Raman scattering and photoluminescence. P-n junction diodes were epitaxially obtained on 4H-SiC substrates. Aluminum and nitrogen were doped as acceptors and donors, respectively. The LED emitted bluish-purple light with a high brightness of 2.2 mcd at a forward current of 20 mA. Other characteristics were as follows : 420–425 nm peak wavelength, 90 % color purity, and a light output of 4 μW.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Suzuki, A., Ikeda, M., Nagao, N., Matunami, H. and Tanaka, T., J. Appl. Phys. 47 (10), 4546 (1976).Google Scholar
2. Matsunami, H., Ikeda, M., Suzuki, A. and Tanaka, T., IEEE Trans. Electron Devices ED–24, 958 (1977).Google Scholar
3. Nakata, T., Koga, K., Matsushita, Y., Ueda, Y. and Niina, T., Proc. 2nd Int. Conf. Amorphous and Crystalline Silicon Carbide and Related Materials (1988) in preparation for publication.Google Scholar
4. Tairov, Yu.M. and Tsvetkov, V.F., J. Cryst. Growth 52, 146 (1981).Google Scholar
5. Ziegler, G., Lanig, P., Theis, D. and Weyrich, C., IEEE Trans. Electron Devices ED–30, 277 (1983).Google Scholar
6. Koga, K., Nakata, T. and Niina, T., Ext. Abstr. 17th Conf. SSDM, 249 (1985).Google Scholar
7. Glasow, P.A., in Amorphous and Crystalline Silicon Carbide and Related Materials, edited by Harris, G.L. and Yang, C.Y.-W. (Springer Proc. in Phys. 34, pp. 13–33.Google Scholar
8. Koga, K., Nakata, T., Ueda, Y., Matsushita, Y., Fujikawa, Y., Uetani, T. and Niina, T., Ext. Abstr. 176th Society Meeting of the Electrochemical Society, 89, (2), 689 (1989).Google Scholar
9. Dmitriev, V.A., Kogan, L.M., Morozenko, Ya.V., Tsarenkov, B.V. and Cherenkov, A.E., Sov. Phys. Semicond. 23, (1), 23 (1989).Google Scholar
10. Matsushita, Y., Ueda, Y., Nakata, T. and Niina, T., Ext. Abstr. 17th Conf. SSDM, 253(1985).Google Scholar
11. Hagen, S.H., van Kemenade, A.W.C. and van der Does de Bye, J.A.W., J. Lumin. 8, 18 (1973).Google Scholar
12. Ikeda, M., Matsunami, H. and Tanaka, T., Phys. Rev. B 22, 2842 (1980).Google Scholar
13. Ikeda, M., Hayakawa, T., Yamagiwa, S., Matsunami, H. and Tanaka, T., J. Appl.Phys. 50, 8215 (1979).Google Scholar