Hostname: page-component-848d4c4894-4rdrl Total loading time: 0 Render date: 2024-06-22T09:35:27.837Z Has data issue: false hasContentIssue false

Kinetic Control of CaF2 on Si(111) Growth Morphology

Published online by Cambridge University Press:  15 February 2011

J. D. Denlinger
Affiliation:
Department of Physics, University of California, Berkeley, CA 94720 Materials Sciences Division, Lawrence Berkeley Laboratory, Berkeley, CA 94720
Eli Rotenberg
Affiliation:
Department of Physics, University of California, Berkeley, CA 94720 Materials Sciences Division, Lawrence Berkeley Laboratory, Berkeley, CA 94720
U. Hessingert
Affiliation:
Department of Physics FM-15, University of Washington, Seattle, WA 98195
M. Leskovar
Affiliation:
Department of Physics FM-15, University of Washington, Seattle, WA 98195
Marjorie A. Olmstead
Affiliation:
Materials Sciences Division, Lawrence Berkeley Laboratory, Berkeley, CA 94720 Department of Physics FM-15, University of Washington, Seattle, WA 98195
Get access

Abstract

Thin (0.5 to 8 triple layer) CaF2 on Si(111) films were grown using molecular beam epitaxy (MBE) and characterized using an in situ combination of x-ray photoelectron spectroscopy (XPS) and componentresolved x-ray photoelectron diffraction (XPD). We identified surface, bulk-like, and interface F and Ca core-level shifts and used the XPS shifts and XPD modulations to identify the growth modes as a function of the kinetic parameters of CaF2 flux and Si temperature. We identify 3 distinct regimes: (i) for high temperatures and flux we find a complete reacted F-Ca-Si layer, overlaid by 2 layer high islands which coalesce, followed by layer-by-layer growth, (ii) for high temperature and low flux, we find the reacted F-Ca-Si layer to be partially covered with thick islands, and (iii) for low temperatures we find an incompletely occupied F-Ca-Si layer followed by layer-by-layer growth. In all cases we find the buried interface to be structurally identical to the unburied F-Ca-Si layer

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Sinharoy, S., Thin Solid Films 187, 231 (1990).CrossRefGoogle Scholar

2 Schowalter, L. J. and Fathauer, R. W., CRC Crit. Rev. in Solid State Mat. Sci. 15, 367 (1989).CrossRefGoogle Scholar

3 Olmstead, M. A., Uhrberg, R. I. G., Bringans, R. D., and Bachrach, R Z., Phys. Rev. B 35(14), 7526 (1987).CrossRefGoogle Scholar

4 Rieger, D., Himpsel, F. J., Karlsson, U. O., McFeely, F. R., Morar, J. F., and Yarmoff, J. A., Phys. Rev. B 34(10), 7295 (1986).CrossRefGoogle Scholar

5 Hashimoto, S., Peng, J.-L., Gibson, W. M., Schowalter, L. J., and Fathauer, R. W., Appl. Phys. Lett. 47,1071 (1985).CrossRefGoogle Scholar

6 Denlinger, J. D., Rotenberg, Eli, Leskovar, M., Hessinger, U., Olmstead, M. A., Appl. Phys. Lett., 62(17), 2057 (1993).CrossRefGoogle Scholar

7 Rotenberg, Eli, Denlinger, J. D., Leskovar, M., Hessinger, U., Marjorie Olmstead, A., J. Vac. Sci. Technol B 11(4) (1993, in press).CrossRefGoogle Scholar

8 Barton, J. J., Phys. Rev. Lett., 61, 1356 (1988).CrossRefGoogle Scholar

9 Rotenberg, Eli, Denlinger, J. D., Leskovar, M., Hessinger, U., Olmstead, Marjorie A., to be published.Google Scholar

10 Denlinger, J. D., Thesis, University of California at Berkeley (1993).Google Scholar

11 Lucas, C. A., Wong, G. C. L., Loretto, D., Phys. Rev. Lett. 70(12), 1826 (1993).CrossRefGoogle Scholar

12 Lucas, C. A., Wong, G. C. L., Loretto, D., this conference.Google Scholar

13 Alvarez, J. C. et al., Semicond. Sci. Technol. 7, 1431 (1992).CrossRefGoogle Scholar

14 Himpsel, F. J., Karlsson, U. O., Morar, J. F., Rieger, D., and Yarmoff, J. A., Phys. Rev. Lett. 56(14), 1497 (1986)CrossRefGoogle Scholar

15 atsch, R. and Zangwill, A., Surface Science, in press,Google Scholar

16 Cho, C. C., Kim, T. S., Gnade, B. E., and Liu, H. Y., Appl. Phys. Lett. 60, 338 (1992).CrossRefGoogle Scholar

17 Asano, T., Ishiwara, H., and Kaifu, N., Jap. J. Appl. Phys. 22, 1474 (1983).CrossRefGoogle Scholar