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In-Situ Quasi-Real Time Observations of the Deformation of α-Brass Bicrystals via Synchrotron X-Ray Topography

Published online by Cambridge University Press:  15 February 2011

Z. Zeng ,
Z. Rek  and
J. C. Bilello
Z. Zeng
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI 48109-2136
Z. Rek
Affiliation:
Stanford Synchrotron Radiation Laboratory, Stanford University, CA 94309
J. C. Bilello
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI 48109-2136
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Abstract

Real-time studies of the deformation behavior of a-brass bicrystals were conducted via in-situ synchrotron white beam X-ray topography (SWBXRT). The object of this work was to understand the role of internal interfaces such as grain boundaries, in controlling the mechanical behavior of materials. A brass bicrystal, in which the two grains made 5° of tilt and 11° of twist with respect to each other was grown by the Bridgman method. Observations were performed by straining the bicrystal in a microtensile stage while stop-action X-ray diffraction topographs were taken. Slip initiated in the grain with the most favorable Schmid factor at a stress level of 1.4MPa which was 5% of the macroyield stress. Since the grain boundary acted as a barrier to slip, the next grain did not slip until the dislocation pile-up at the grain boundary reached a critical value.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 307: Symposium L – Applications of Synchrotron Radiation Techniques to Materials Science , 1993 , 225
Copyright
Copyright © Materials Research Society 1993

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References

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