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In-situ Kinetics Studies on Hydrogenation of Transition Metal (=Ti, Fe) Doped Mg Films

Published online by Cambridge University Press:  31 January 2011

Zhuopeng Tan ,
Edwin J. Heilweil  and
Leonid Bendersky
Zhuopeng Tan
Affiliation:
zhuopeng@gmail.com, National Institute of Standards and Technology, Materials Science and Engineering Laboratory, Gaithersburg, Maryland, United States
Edwin J. Heilweil
Affiliation:
edwin.heilweil@nist.gov, National Institute of Standards and Technology, Physics Laboratory, Gaithersburg, Maryland, United States
Leonid Bendersky
Affiliation:
leoben@nist.gov, National Institute of Standards and Technology, Materials Science and Engineering Laboratory, Gaithersburg, Maryland, United States
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Abstract

In this paper we report on kinetics studies of the growth rates of a hydride phase during the metal-hydride phase transformation of Mg films doped with transition metals (=Ti, Fe). Infrared emission imaging of wedge-shaped thin films during hydrogen loading reveals different effects of Ti and Fe additives on Mg hydride growth rates. Compared to hydrogenation of pure Mg, Ti addition (atomic fraction 1.6 % and 2.3 %) does not increase the Mg hydride growth rate. However, this doping results in the formation of a thicker hydride layer residing on top of the films. The hydrogenation rate is increased by an order of magnitude for addition of atomic fraction 3.1 % of Fe and the thickness of Mg hydride layer is more than twice that of the hydride layer during hydrogenation of pure Mg. Results obtained here can be used to guide powder design for hydrogen storage applications.

Keywords

kineticsthin filmhydrogenation
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1216: Symposium W – Hydrogen Storage Materials , 2009 , 1216-W04-04
Copyright
Copyright © Materials Research Society 2010

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