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Initial Stage of Oxidation on Si(111)-7×7 Surface Investigated by Scanning Tunneling Microscope

Published online by Cambridge University Press:  15 February 2011

Jeong Sook Ha
Affiliation:
Research Department, Electronics and Telecommunications Research Institute, Taejon, 305-600, Korea
Kang-Ho Park
Affiliation:
Research Department, Electronics and Telecommunications Research Institute, Taejon, 305-600, Korea
Seong-Ju Park
Affiliation:
Department of Materials Science and Engineering, Kwangju Institute of Science and Technology, Kwangju, 506-303, Korea
El-Hang Lee
Affiliation:
Research Department, Electronics and Telecommunications Research Institute, Taejon, 305-600, Korea
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Abstract

The initial oxidation of Si(111)-7×7 surface has been investigated by taking the STM images of samples dosed with oxygen at room temperature and high temperatures between 500°C and 750 °C. In particular, different site selectivities between two oxygen-induced features, bright and dark sites, were observed and explained in terms of the difference in potential energy curves. In addition to such a strong site selectivity under low oxygen partial pressure (l×10-9 torr), heavy surface etching by oxygen was observed at higher O2 partial pressures and temperatures resulting in the high density of monolayer-deep etch marks on terraces.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

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References

1. Ibach, H., Bruchman, H. D., and Wagner, H., Appl. Phys. A 29, 113 (1982).Google Scholar
2. Hollinger, G. and Himpsel, F. J., Phys. Rev. B 28, 3651 (1983).Google Scholar
3. Morgen, P., Wurth, W., and Umbach, E., Surf. Sci. 152/153, 1086 (1985).Google Scholar
4. Nishijima, M., Edamoto, K., Kubota, Y., Kobayashi, H., and Onchi, M., Surf. Sci. 158, 422 (1985).Google Scholar
5. Leibsle, F. M., Samsavar, A., and Chiang, T.-C., Phys. Rev. B 38, 5780 (1988).Google Scholar
6. Avouris, Ph., Lyo, I.-W., and Boso, F., J. Vac. Sci. Technol. B 9, 424 (1991).Google Scholar
7. Hasegawa, T., Kohno, M., and Hosoki, S., Jpn. J. Appl. Phys. 33, 3702 (1994).Google Scholar
8. Lyo, I. -W., Avouris, Ph., Schubert, B., and Hoffman, R., J. Phys. Chem. 94, 4400 (1990).Google Scholar
9. Seiple, J., Pacquet, J., Meng, Z., and Pelz, J. P., J. Vac. Sci. Technol. A 11, 1649 (1993).Google Scholar
10. Donig, F., Felz, A., Kulakov, M., Hessel, H. E., Memmert, U., and Behm, R. J., J. Vac. Sci. Technol. B 11, 1955 (1993).Google Scholar
11. Pelz, J. P. and Koch, R. H., Phys. Rev. B 42, 3761 (1990).Google Scholar
12. Hammers, R. J., Tromp, R. M., and Demuth, J. E., Phys. Rev. Lett. 56, 1972 (1986).Google Scholar
13. Ihara, S., Uda, T., and Hirao, M., Appl. Surf. Sci. 60/61, 22 (1992).Google Scholar
14. Pelz, J. P. and Koch, R. H., J. Vac. Sci. Technol. B 9, 775 (1991).Google Scholar
15. Ha, J. S., Park, K. -H., Park, S. -J., and Lee, E. -H., to be published.Google Scholar