Hostname: page-component-77c89778f8-vpsfw Total loading time: 0 Render date: 2024-07-21T23:23:16.029Z Has data issue: false hasContentIssue false
  • English
  • Français

Influence of Ion Irradiation on the Microstructure of Fe/Ti Multilayers

Published online by Cambridge University Press:  10 February 2011

M. Kopcewicz ,
A. Grabias ,
J. Jagielski  and
T. Stobiecki
M. Kopcewicz
Affiliation:
Institute of Electronic Materials Technology, Wó1czyfiska 133, 01–919 Warsaw, Poland
A. Grabias
Affiliation:
Institute of Electronic Materials Technology, Wó1czyfiska 133, 01–919 Warsaw, Poland
J. Jagielski
Affiliation:
Institute of Electronic Materials Technology, Wó1czyfiska 133, 01–919 Warsaw, Poland
T. Stobiecki
Affiliation:
Dept. of Electronics, University of Mining and Metallurgy, Al. Mickiewicza 30, Cracow, Poland
Get access

Abstract

The amorphization of the Fe/Ti multilayers due to ion-beam mixing induced by Ar and Kr ions is studied by conversion electron Mossbauer spectroscopy. Formation of the bcc-FeTi solid solution and the amorphous FeTi phase is studied as a function of ion dose for samples with the Fe to Ti thickness ratio of 1 and the modulation wavelengths of 20 and 60 nm. After reaching maximum abundance the amorphous fraction decreases at high ion doses.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 504: Symposium KK – Atomistic Mechanisms in Beam Synthesis & Irradiation… , 1997 , 215
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Chien, C.L., Liou, S.H., Phys. Rev. B 31, 8238 (1985).Google Scholar
2. Rodmacq, B., Hillairet, J., Laugier, J., Chamberod, A., J. Phys.:Condens. Matter 2, 95 (1990).Google Scholar
3. Kopcewicz, M., Stobiecki, T., Czapkiewicz, M., Grabias, A., J. Phys.:Condens. Matter 9, 103 (1997).Google Scholar
4. Brenier, R., Capra, T., Thevenard, P., Perez, A., Treilleux, M., Rivory, J., Dupuy, J., Guiraud, G., Phys. Rev. B 41,11784 (1990).Google Scholar
5. Brenier, R., Perez, A., Thevenard, P., Capra, T., Mater. Sci. Eng. 69, 83 (1985).Google Scholar
6. Kopcewicz, M., Jagielski, J., Stobiecki, T., Stobiecki, F., Gawlik, G., J. Appl. Phys. 76, 5232 (1994).Google Scholar
7. Biersack, J.P., Haggmark, L.G., Nucl. Instr. Meth. 174, 257 (1980).Google Scholar
8. Hesse, J., Rubartsch, A., J. Phys. E 7, 526 (1974).Google Scholar
9. LeCaer, G., Dubois, J.M., J. Phys. E 12, 1083 (1979).Google Scholar
10. Brand, R.A., Lauer, J., Herlach, D.M., J. Phys. F 31, 675 (1983).Google Scholar
11. Linker, G., Nucl. Instr. Meth. B 19/20, 526 (1987).Google Scholar
12. Williamson, D.L., Clemens, B., Hyperfine Inter. 42, 967 (1988).Google Scholar