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Immittance Data-Handling/Analyzing Criteria For Heterogeneous Systems

Published online by Cambridge University Press:  10 February 2011

Mohammad A. Alim
Mohammad A. Alim*
Affiliation:
Hubbell Incorporated, The Ohio Brass Company 8711 Wadsworth Road, Wadsworth, Ohio 44281
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Abstract

The factors determining electrical characteristics using immittance data of heterogeneous systems are not identical to those established with devices based on single-crystal/single-junction (SCSJ) technology. The ”state of normalization” using ”physical geometrical factors” of the asmeasured immittance quantities does not provide a SCSJ-like straightforward interpretation of simultaneously operative phenomena. The normalization procedure can the vitiate identity of each phenomenon occurring within the series-parallel microstructural network of electrical paths. The advantage of using the as-measured immittance data in delineating simultaneously operative phenomena is emphasized. An approach to data-handling/analyzing is proposed considering the limitations and conditions of utilizing the as-measured immittance data. The ”state of normalization” using ”physical geometrical factors” can only be executed for a specific type of phenomenon when isolated from the total electrical behavior.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 411: Symposium T – Electricaly-Based Microstructural Characterization , 1995 , 13
Copyright
Copyright © Materials Research Society 1996

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References

REFERENCES

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