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Imaging of the Carrier Density of States in Low Dimensional Structures Using Electrostatic Force Microscopy

Published online by Cambridge University Press:  10 February 2011

D. Gekhtman ,
Z. B. Zhang ,
D. Adderton ,
M. S. Dresselhaus  and
G. Dresselhaus
D. Gekhtman
Affiliation:
Department of Physics, Massachusetts Institute of Technology, Cambridge, MA 02139
Z. B. Zhang
Affiliation:
Department of Physics, Massachusetts Institute of Technology, Cambridge, MA 02139
D. Adderton
Affiliation:
Digital Instruments, Santa Barbara, CA 93117
M. S. Dresselhaus
Affiliation:
Department of Physics, Massachusetts Institute of Technology, Cambridge, MA 02139 Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA 02139
G. Dresselhaus
Affiliation:
Francis Bitter Magnet Lab, Massachusetts Institute of Technology, Cambridge, MA 02139
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Abstract

In this work we show that scanning probe electrostatic force microscopy (EFM) can be applied to low dimensional electronic nanostructures for imaging the density of states of quantum confined carriers. The results on EFM studies are presented for quasione- dimensional (ID) Bi quantum wire arrays and quasi-two-dimensional (2D) GaAs/AlxGa1-x As multiple quantum well structures.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 545: Symposium Z – Thermoelectric Materials 1998 - The Next Generation… , 1998 , 345
Copyright
Copyright © Materials Research Society 1999

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