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Hyperfine Fields in Ultrathin Fe and FeAu Alloy Films on Au (111)

Published online by Cambridge University Press:  03 September 2012

M. Brockmann
Affiliation:
Universität Regensburg, Institut für Angewandte Physik, Universitätsstraβe 31, D-8400 Regensburg, Germany
L. Pfau
Affiliation:
Universität Regensburg, Institut für Angewandte Physik, Universitätsstraβe 31, D-8400 Regensburg, Germany
G. Lugert
Affiliation:
Universität Regensburg, Institut für Angewandte Physik, Universitätsstraβe 31, D-8400 Regensburg, Germany
G. Bayreuther
Affiliation:
Universität Regensburg, Institut für Angewandte Physik, Universitätsstraβe 31, D-8400 Regensburg, Germany
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Abstract

Magnetic properties of ultrathin Fe and Fe60Au40, alloy films on Au (111) were studied by SQUID Magnetometry and conversion electron Mössbauer spectroscopy. In order to get information on the influence of interdiffusion, iron films with thin alloy zones at the interfaces to Au have been prepared by co-evaporation of iron and gold and compared with iron films with presumably sharp interfaces. It was found that the presence of an 0.5 ML (Mass coverage in Monolayer) alloy zone reduces the effective magnetic interface anisotropy field and affects the growth mode of a subsequently deposited iron film such that the film is more sensitive to annealing. Groundstate Magnetic Moments and hyperfine fields are significantly enhanced in Fe/Au(111) (tFe ≤ 4 ML) and Fe60Au40 films, compared to bulk Fe.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1. Lugert, G., Robi, W., Pfau, L., Brockmann, M. and Bayreuther, G., J.M.M.M april 1993 (in press).Google Scholar
2. Marlière, C., Chauvineau, J. P. and Renard, D., Thin Solid Films 189, 359 (1990).Google Scholar
3. Stroscio, J. A., Pierce, D. T., Dragóse, R. A. and First, P. N., J. Vac. Sci. Technol. AIO, 1981 (1992)Google Scholar
4. Billard, L., Chambered, A., Solid State Comm. 17, 113 (1975)Google Scholar
5. Window, B., Phys. Rev. B 6, 2013 (1972)Google Scholar
6. Felsch, W., Z. Angew. Phys. 29, 217 (1970)Google Scholar
7. Lugert, G., Bayreuther, G., Phys. Rev. B 38, 11068 (1988)Google Scholar