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Hreels Studies of KxC60 Thin Films

Published online by Cambridge University Press:  15 February 2011

G.P. Lopinski
Affiliation:
Dept. of Physics, Penn State University, University Park, PA 16802
M.G. Mitch
Affiliation:
Dept. of Physics, Penn State University, University Park, PA 16802
S.J. Chase
Affiliation:
Dept. of Physics, Penn State University, University Park, PA 16802
J.S. Lannin
Affiliation:
Dept. of Physics, Penn State University, University Park, PA 16802
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Abstract

High resolution electron energy loss spectroscopy has been used to investigate the vibrational and electronic excitations of single-phase, crystalline AxC60 films. Substantial changes in intramolecular mode frequencies and intensities with alkali concentration arise from charge transfer effects as well as free carrier screening. For x=4, splitting of the t1u band is observed, resulting in an insulating phase with an estimated gap of 0.3-0.4eV. Screening in the x=3 phase results in enhanced surface sensitivity and deviations from bulk stoichiometry at the surface of metallic films are observed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

[1] Stepniak, F., Benning, P.J., Poirier, D.M., and Weaver, J.H., Phys. Rev. B48, 1899 (1993).Google Scholar
[2] Benning, P.J., Stepniak, F., and Weaver, J.H., Phys. Rev. B48, 9086 (1993).Google Scholar
[3] Sohmen, E. and Fink, J., Phys. Rev. B47, 14532 (1993).Google Scholar
[4] Gensterblum, G. et al. , Phys. Rev. Lett. 67, 2171 (1991).Google Scholar
[5] Gensterblum, G. et al. , J. Phys. Chem. Solids 53, 1427 (1992).Google Scholar
[6] Gensterblum, G. et al. , Appl. Phys. A56, 175 (1993).Google Scholar
[7] Modesti, S., Cerasari, S., and Rudolf, P., Phys. Rev. Lett. 71, 2469 (1993).Google Scholar
[8] Jiang, L.Q. and Koel, B.E., Phys. Rev. Lett. 72, 140 (1994).Google Scholar
[9] Poirier, D.M., Appl. Phys. Lett. 64, 1356 (1994).Google Scholar
[10] Benning, P.J. et al. , Phys. Rev. B45, 6899 (1992).Google Scholar
[11] Lof, R.W., Veenendaal, M.A. van, Koopmans, B., Jonkman, H.T., and Sawatzky, G.A., Phys. Rev. Lett. 68, 3924 (1992).Google Scholar
[12] Erwin, S.C. in Buckminsterfullerenes, eds. Billups, W.E. and Ciufolini, M.A. (VCH, New York, 1992).Google Scholar
[13] Palmer, R.E., Annett, J.F., and Willis, R.F., Phys. Rev. Lett. 58, 2490 (1987).Google Scholar
[14] Iwasa, Y. et al. , J. Phys. Chem. Solids 54, 1795 (1993).Google Scholar
[15] Benning, P.J. et al. , Phys. Rev. 47, 13843 (1993).Google Scholar
[16] Erwin, S.C. and Bruder, C., Physica B 199–200, 600 (1994).Google Scholar
[17] Mitch, M.G., Lopinski, G.P., Chase, S.J., and Lannin, J.S., Phys. Rev. B, to be published. Google Scholar
[18] Martin, M.C., Koller, D., and Mihaly, L., Phys. Rev. B47, 14607 (1993).Google Scholar
[19] Fu, K.J. et al. , Phys. Rev. B46, 1937 (1992).Google Scholar
[20] Pichler, T., Matus, M., and Kuzmany, H., Solid State Commun. 86, 221 (1993).Google Scholar
[21] Rice, M.J. and Choi, H.Y., Phys. Rev. B45, 10173 (1992).Google Scholar
[22] Cox, P.A., Hill, M.D., Peplinskii, F., and Egdell, R.G., Surf. Sci. 141, 13 (1984).Google Scholar
[23] Coulombeau, C. et al. , C.R. Acad. Sci. Paris 313, 1387 (1991).Google Scholar
[24] Prassides, K. et al. , Chem. Phys. Lett. 187, 455 (1991).Google Scholar
[25] Wertheim, G.K., Buchanan, D.N.E., Chaban, E.E., and Rowe, J.E., Solid State Commun. 83, 785 (1992).Google Scholar