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High Thermal Stability Electrooptic Chromophores And New Integrated Optical Polymer Devices

Published online by Cambridge University Press:  16 February 2011

S. Yamada
Affiliation:
Department of Physics and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104–6396
Y. M. Cai
Affiliation:
Department of Physics and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104–6396
R. F. Shi
Affiliation:
Department of Physics and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104–6396
M. H. Wu
Affiliation:
Department of Physics and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104–6396
W. D. Chen
Affiliation:
Department of Physics and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104–6396
Q. M. Qian
Affiliation:
Department of Physics and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104–6396
A. F. Garito
Affiliation:
Department of Physics and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104–6396
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Abstract

A new class of high thermal stability fused-ring guest chromophores intended for incorporation into highly stable host polyimides has been successfully developed. Thermal stabilities far in excess of 300°C have been achieved for both the pure guest and the guest-host polyimide systems. The Microscopic second order nonlinear optical properties of the guest chromophores have been characterized both theoretically and experimentally. The achievement of the new high temperature EO chromorphores and polyimide formulations have directly resulted in the discovery of new EO device designs and architectures.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

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References

REFERENCES

[1] See, for example, Polymers for Lightwave and Integrated Optics: Technology and Applications, Homack, L.A., ed. (Marcel Dekker, New York, 1992).Google Scholar
[2] Garito, A.F., Wu, J., Lipscomb, G.F., and Lytel, R., Mat. Res. Soc. Proc. 173, 467 (1990).CrossRefGoogle Scholar
[3] See, for example, Matsuura, T., Ando, S., Matsui, S., Hirata, H., Sasaki, S. and Yamamoto, F., Electron. Lett. 29, 269 (1993) and ref. therein.Google Scholar
[4] Shi, R.F., Wu, M.H., Yamada, S., Cai, Y.M., and Garito, A.F., Appl. Phys. Lett. 63, 1173 (1993).Google Scholar
[5] Heflin, J.R. and Garito, A.F. in ref. 1.Google Scholar
[6] Qian, Q. M., Chen, W. D., Cai, Y.M., Shi, R.F., and Garito, A.F., Appl. Phys. Lett. (In press).Google Scholar