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High Temperature Thermal Analysis of Graphite and Silicon Carbide with Millimeter-Wave Radiometry

Published online by Cambridge University Press:  08 March 2011

Paul P. Woskov  and
S. K. Sundaram
Paul P. Woskov
Affiliation:
MIT Plasma Science and Fusion Center, 167 Albany Street, NW16-110, Cambridge, MA 02139, U.S.A.
S. K. Sundaram
Affiliation:
Pacific Northwest National Laboratory, 902 Battelle Boulevard, K6-24, Richland, WA 99352, U.S.A.
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Abstract

Millimeter-wave thermal analysis instrumentation is being developed for characterization of high temperature materials required for diverse fuel and structural needs in extreme high temperature reactor environments. A two-receiver 137 GHz system with orthogonal polarizations for anisotropic properties resolution has been implemented at MIT and is being tested with graphite and silicon carbide specimens at temperatures up to 1300ºC. Real time measurement sensitivity to submillimeter surface displacement and simulated anisotropic surface emissivity is demonstrated.

Keywords

sensornuclear materialsC
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1298: Symposium Q/R/T – Advanced Materials for Applications in Extreme Environments , 2011 , mrsf10-1298-r11-08-q12-08
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

1. Woskov, P.P., Sundaram, S.K., Daniel, G., Machuzak, J.S., Thomas, P., “Millimeter-Wave Monitoring of Nuclear Waste Glass Melts – An Overview”,Environmental Issues and Waste Management Technologies VII, (Ceramic Transactions, Vol. 132, 2002) pp. 189–201.Google Scholar
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