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High Resolution Time and Frequency Resolved Spectroscopy for the Study of Photophysical Processes in Luminescent Materials

Published online by Cambridge University Press:  10 February 2011

Bruce Farris ,
Anthony Smith ,
Richard Martoglio  and
Lee H. Spangler
Bruce Farris
Affiliation:
Department of Chemistry, Montana State University, Bozeman, MT 59717
Anthony Smith
Affiliation:
Department of Chemistry, Montana State University, Bozeman, MT 59717
Richard Martoglio
Affiliation:
Department of Chemistry, Montana State University, Bozeman, MT 59717
Lee H. Spangler
Affiliation:
Department of Chemistry, Montana State University, Bozeman, MT 59717
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Abstract

A method for obtaining time and frequency resolved spectra with high spectral and temporal resolution over a broad spectral range is presented. Step – scan Fourier transform spectroscopy permits spectral coverage from UV to mid IR with sub nanosecond resolution making it possible to track emission from multiple manifolds with full temporal resolution in a single experiment. Data for several rare-earth doped crystalline materials exhibiting multiple emission bands and including evidence of energy transfer is shown.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 560: Symposium E – Luminescent Materials , 1999 , 145
Copyright
Copyright © Materials Research Society 1999

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References

REFERENCES

1. Riseberg, L.A. and Weber, M.J., in Progress In Optics XIV, edited by Wolf, E., (North-Holland, 1976), pp. 91–157.Google Scholar
2. Connes, J. and Connes, P.J., J. Opt. Soc. Am. 56, 896 (1966).Google Scholar
3. Adapted from Gruber, J., Seltzer, M., Pugh, V., and Richardson, F., J. Appi. Phys. 77, 5882 (1995).Google Scholar
4. Zverev, G., Kolodnyi, G., and Onishchenko, A., Sov. Phys. JETP 33, 497 (1971)Google Scholar
5. Ashurov, M. et al. , Morgan. Mater. 15, 979 (1979)Google Scholar
6. Fan, T., Huber, G., Byer, R., Mitzscherlich, P., IEEE J. Quant. Elect. 24, 924 (1988).Google Scholar
7. Armagan, G., DiBartolo, B., Buoncristiani, A., J. Lumin. 44, 129 (1989).Google Scholar
8. Jani, M., Reeves, R., Powell, R., Quarles, G., Esterowitz, L., J. Opt. Soc. Am. B 8, 741 (1991).Google Scholar
9. Barnes, N., Filer, E., Naranjo, F., Rodriguez, W., Kokta, M., Opt. Lett. 14, 435 (1989).Google Scholar