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Grazing Incidence Measurements of Polarized Electroabsorption and Light Soaking Effect on Amorphous Silicon Based Solar Cells

Published online by Cambridge University Press:  10 February 2011

Lin Jiang ,
Eric A. Schiff ,
Qi Wang ,
S. Guha  and
J. Yang
Lin Jiang
Affiliation:
Department of Physics, Syracuse University, Syracuse, NY 13244-1130
Eric A. Schiff
Affiliation:
Department of Physics, Syracuse University, Syracuse, NY 13244-1130
Qi Wang
Affiliation:
National Renewable Energy Laboratory, Golden CO 80401
S. Guha
Affiliation:
United Solar Systems Corp., 1100 West Maple Road, Troy, M1 48084
J. Yang
Affiliation:
United Solar Systems Corp., 1100 West Maple Road, Troy, M1 48084
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Abstract

Grazing-incidence measurements of polarized electroabsorption (EA) in p-i-n solar cells based on hydrogenated amorphous silicon (a-Si:H) are presented. We confirm polarized electroabsorption effect of a-Si:H with the present “sandwich” electrodes, in fact, we find a significantly stronger polarization dependence compared with earlier work based on electroabsorption detected using coplanar electrodes on a-Si:H thin films. We did not reproduce the significant dependence of the polarized electroabsorption upon light soaking, which was found in previous work with coplanar electrodes. We speculate the difference between two electrode geometries is due to the space charge and two dimensional fields.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 507: Symposium A – Amorphous & Microcrystalline Silicon Technology 1998 , 1998 , 631
Copyright
Copyright © Materials Research Society 1998

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References

REFERENCES

[1] Jiang, L., Wang, Q., Schiff, E. A., Guha, S., Yang, J., Appl. Phys. Lett. 72, 1060 (1998).Google Scholar
[2] Weiser, G., Dersch, U., and Thomas, P., Philos. Mag. 57 721 (1988).Google Scholar
[3] Okamoto, H., Hattori, K., and Hamakawa, Y., J. Non-Cryst. Solids 137&138, 627 (1991) and 164-166, 893 (1993).Google Scholar
[4] Mescheder, U. and Weiser, G., J. Non-Crystalline Solids 77 571 (1985)Google Scholar
[5] Shimizu, K., Shiba, T., Tabuchi, T., and Okamoto, H., Jpn. J. Phys. 36 29 (1997)Google Scholar
[6] Hata, N., Kamei, T., Okamoto, H., and Matsuda, A., Amorphous and Microcrystalline Silicon Technology-1997, edited by Wagner, S., Hack, M., Schiff, E. A., Schropp, R., and Shimizu, I., 467 61 (Pittsburg, 1997).Google Scholar
[7] Jiang, L., Wang, Q., Schiff, E. A., Guha, S., Yang, J., Deng, X., Appl. Phys. Lett. 69 3063 (1996)Google Scholar