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Grain Boundary Migration in Alumina

Published online by Cambridge University Press:  21 March 2011

Jeffrey K. Farrer ,
N. Ravishankar ,
Joseph R. Michael  and
C. Barry Carter
Jeffrey K. Farrer
Affiliation:
Dept. of Chemical Engineering and Materials Science, University of Minnesota421 Washington Ave. S.E., Minneapolis MN 55455, USA
N. Ravishankar
Affiliation:
Dept. of Chemical Engineering and Materials Science, University of Minnesota421 Washington Ave. S.E., Minneapolis MN 55455, USA
Joseph R. Michael
Affiliation:
Materials Characterization Dept., Sandia National Laboratory, Albuquerque, NM 87185-1405
C. Barry Carter
Affiliation:
Dept. of Chemical Engineering and Materials Science, University of Minnesota421 Washington Ave. S.E., Minneapolis MN 55455, USA
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Abstract

The sintering process of ceramics involves grain-boundary migration (GBM) that is accompanied by mass transport across an interface. In this study, electron backscatter diffraction (EBSD) has been used to examine grain-boundary migration in alumina bicrystals with liquid films at the interface. EBSD patterns, taken near the sintered interface, have been used to study the effects of crystallography on GBM and to study the orientation relationships within the migrated regions of the crystal. Results indicate that the direction of migration is not always the same as that predicted by the current theories on GBM. It was also found that there may be small-angle misorientations in the migrated regions.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 652: Symposium Y – Influences of Interface & Dislocation Behavior on Microstructure Evolution , 2000 , Y1.2
Copyright
Copyright © Materials Research Society 2001

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References

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