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Fundamental Criteria for the Propagation of Telephone Cord Buckles Beneath DLC Films on Glass Substrates

Published online by Cambridge University Press:  21 March 2011

Myoung-Woon Moon ,
Kyang-Ryel Lee ,
Jin-Won Chung  and
And Kyu Hwan Oh
Myoung-Woon Moon
Affiliation:
Material Science and Engineering, Seoul National University, Seoul 151-742, KOREA.
Kyang-Ryel Lee
Affiliation:
Korea Institute of Science and Technology, P.O.Box 131, Cheongryang, Seoul 130-650, KOREA.
Jin-Won Chung
Affiliation:
Korea Institute of Science and Technology, P.O.Box 131, Cheongryang, Seoul 130-650, KOREA.
And Kyu Hwan Oh
Affiliation:
Material Science and Engineering, Seoul National University, Seoul 151-742, KOREA.
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Abstract

The topology of telephone cord buckles that form beneath compressed diamond-like carbon films (DLC) on glass substrates has been characterized with Atomic Force Microscopy (AFM) and with the Focused Ion Beam (FIB). Using AFM with 2nm resolution, the wavelength and amplitude of the buckles and their profiles have been measured. It has been found that, within each wavelength, the profile has symmetric and asymmetric segments. These changes have been related to differences in local mode mixity around the periphery of each repeat unit along the buckle, resulting in a fundamental rationale for the factors governing the wavelength. Sections made through various segments of the buckle by using the FIB imaging system result in local changes in the shape and size of the buckles that provide further insight into the buckle propagation criterion.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 695: Symposium L – Thin Films: Stresses and Mechanical Properties IX , 2001 , L2.4.1
Copyright
Copyright © Materials Research Society 2002

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References

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