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Fabrication and Magneto-Capacitance Measurements of PbNb0.02Zr0.2Ti0.8O3/La0.7Sr0.3MnO3/SiO2/Si Structure Grown by Chemical Solution Deposition

Published online by Cambridge University Press:  31 January 2011

Sushma Kotru  and
Harshan V. Nampoori
Sushma Kotru
Affiliation:
skotru@coe.eng.ua.eduskotru@bama.ua.edu, The University of Alabama, ECE, 317 Houser Hall, P.O.Box 870286, Tuscaloosa, Alabama, 35406, United States, 205-349-4792, 205-348-6959
Harshan V. Nampoori
Affiliation:
hvasudevan@bama.ua.edu, The University of Alabama, Department of Electrical and Computer Engineering, Tuscaloosa, Alabama, United States
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Abstract

Multiferroic composite thin films consisting of PbNb0.02Zr0.2Ti0.8O3 (PNZT) and La0.7 Sr0.3 MnO3 (LSMO) were deposited on SiO2/Si substrates. SiO2 films were deposited by pulsed electron deposition and LSMO and PNZT films were prepared using chemical solution deposition process using a metal organic deposition route. Individual films and the test structure PNZT/LSMO/ SiO2/Si were characterized using various characterizing techniques. Preliminary results of magnetic field dependent capacitance (magneto-capacitance) on the test structure are reported. A change in capacitance from 18.92 pf to 5.49 pf is observed as frequency changes from 50 KHz to 1 MHz, when no external magnetic field is applied. When a magnetic field of 330 Oe (positive or negative) is applied, the change in magneto-capacitance is appreciable, with a maximum change of 37 % being observed at a frequency of 1 MHz.

Keywords

ferroelectricitypiezoelectricthin film
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1161: Symposium I – Engineered Multiferroics–Magnetoelectric Interactions, Sensors and Devices , 2009 , 1161-I04-06
Copyright
Copyright © Materials Research Society 2009

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