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Experimental Methods and Data Analysis for Fluctuation Microscopy

Published online by Cambridge University Press:  10 February 2011

P. M. Voyles ,
M. M. J. Treacy ,
J. M. Gibson ,
H-C. Jin  and
J. R. Abelson
P. M. Voyles
Affiliation:
Dept. of Physics, University of Illinois, Urbana, IL 61801, pvoyles@uiuc.edu NEC Research Institute, Princeton, NJ 08540
M. M. J. Treacy
Affiliation:
NEC Research Institute, Princeton, NJ 08540
J. M. Gibson
Affiliation:
Argonne National Laboratory, Argonne, IL 60439
H-C. Jin
Affiliation:
Dept. of Materials Science and Engineering and Coordinated Science Laboratory, University of Illinois, Urbana, IL 61801
J. R. Abelson
Affiliation:
Dept. of Materials Science and Engineering and Coordinated Science Laboratory, University of Illinois, Urbana, IL 61801
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Abstract

We have developed a new electron microscopy technique called fluctuation microscopy which is sensitive to medium-range order in disordered materials. The technique relies on quantitative statistical analysis of low-resolution dark-field electron micrographs. Extracting useful information from such micrographs involves correcting for the effects of the imaging system, incoherent image contrast caused by large scale structure in the sample, and the effects of the foil thickness.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 589 , 1999 , 155
Copyright
Copyright © Materials Research Society 2001

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References

1.Gibson, J. M. and M. M. Treacy, J., Phys. Rev. Letts. 78, 1074 (1997).Google Scholar
2.Mousseau, N. and Lewis, L. J., Phys. Rev. Letts. 78, 1484 (1997).Google Scholar
3.Gibson, J. M. and Treacy, M. M. J., to be published in Ultramicroscopy.Google Scholar
4.Voyles, P. M., Gibson, J. M., and Treacy, M. M. J., to be published in J. Electron Microscopy.Google Scholar
5.Gibson, J. M., Treacy, M. M. J., Voyles, P. M., Jin, H-C., and Abelson, J. R., Appl. Phys. Letts. 73, 3093 (1998).Google Scholar
6.Treacy, M. M. J., Gibson, J. M., and Keblinski, P. J., J. Non-Cryst. Solids 231, 99 (1998).Google Scholar
7.Zuo, J. M., Ultramicroscopy 66, 21 (1996).Google Scholar
8.Daberkow, I., Hermann, K.-H., Liu, L., Rau, W. D., and Tietz, H., Ultramicroscopy 64, 35 (1996).Google Scholar
9.Krivanek, O. L. and Mooney, P. E., Ultramicroscopy 49, 95 (1993).Google Scholar
10.Treacy, M. M. J. and Gibson, J. M., Ultramicroscopy 52, 31 (1993).Google Scholar
11.Pinarbasi, M., Maley, N., Myers, A. M., and Abelson, J. R., Thin Solid Films 171, 217 (1989); M. Pinarbasi, M. J. Kushner, and J. R. Abelson, J. Appl. Phys. 68, 2255 (1990).Google Scholar
12.Jellison, G. E. Jr, and Modin, F. A., Appl. Phys. Lett. 69, 371 (1996).Google Scholar
13.Freeman, L. A., Howie, A., Mistry, A. B., and Gaskell, P. H. in The Structure of Non-Cryst. Mats. edited by Gaskell, P. H. (Taylor & Francis, London, 1976) p. 245.Google Scholar