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Experimental and Theoretical Study of the New Image Force Microscopy Principle (Invited Paper)

Published online by Cambridge University Press:  20 May 2011

H. Kumar Wickramasinghe  and
Indrajith Rajapaksa
H. Kumar Wickramasinghe
Affiliation:
Department of Electrical Engineering and Computer Science University of California, Irvine, CA, 92697
Indrajith Rajapaksa
Affiliation:
Department of Electrical Engineering and Computer Science University of California, Irvine, CA, 92697
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Abstract

A new technique in microscopy is demonstrated in which the domain of Atomic Force Microscopy (AFM) is extended to optical spectroscopy at the nanometer scale. Molecular resonance of feature sizes down to the single molecular level were detected and imaged purely by mechanical detection of the force gradient between the interaction of the optically driven object molecular dipole and its mirror image in a Platinum coated scanning probe tip. We provide full experimental details including a basic theory for this new technique. The microscopy and spectroscopy technique is extendable to frequencies ranging from radio to infrared and the ultra violet.

Keywords

nanoscalescanning probe microscopy (SPM)optical
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1318: Symposium SS/TT/UU/VV – Advances in Spectroscopy and Imaging of Surfaces and Nanostructures , 2011 , mrsf10-1318-vv09-06
Copyright
Copyright © Materials Research Society 2011

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References

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