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Examination of Titanium Oxides, Lead Oxides and Lead Titanates Using X-Ray Diffraction and Raman Spectroscopy

Published online by Cambridge University Press:  21 February 2011

Lynnette D. Madsen  and
Louise Weaver
Lynnette D. Madsen
Affiliation:
McMaster University, Hamilton, Ontario L8S 4L7 P.O. Box 3511, Station C, Ottawa, Ontario, Canada, KIY 4H7
Louise Weaver
Affiliation:
Northern Telecom Electronics Limited (NTEL), P.O. Box 3511, Station C, Ottawa, Ontario, Canada, KIY 4H7
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Abstract

Single oxides (with titanium or lead) deposited as thin films by low pressure metalorganic chemical vapour deposition were investigated by x-ray diffraction and Raman spectroscopy. Examination of mixed oxides (titanates) and silicates were also carried out using these techniques. The crystallographic nature of these thin films were examined and comparisons made to their bulk counterparts. The deposition and anneal conditions 600 for producing cubic PbTiO3 films are discussed briefly.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 310: Symposium N – Ferroelectric Thin Films III , 1993 , 385
Copyright
Copyright © Materials Research Society 1993

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