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Exafs Study of the Stability of Amorphous TbFe Thin Films

Published online by Cambridge University Press:  03 September 2012

Mahesh G. Samant
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120-6099.
Ernesto E. Marinero
Affiliation:
IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, CA 95120-6099.
Clifford Robinson
Affiliation:
Raytheon Corporation, Research Division, 131 Spring St, Lexington, MA 02173.
G. S. Cargill III
Affiliation:
IBM Research Division, T. J. J. Watson Research Center, Yorktown Heights, NY 10598.
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Abstract

EXAFS is used to measure the local atomic structure of Fe in Au doped Tb-Fe thin film alloys. The as deposited sample shows structural fcatures which are essentially identical to those of the undoped films. Au additions stabilizes the amorphous structure against recrystallization, however, the loss of magnetic anisotropy under thermal annealing is not reduced. This demonstrates that magnetic relaxation in these alloys does not involve crystallization of the amorphous structure.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

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References

REFERENCES

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