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EXAFS Determination of Bond Lengths in Zn1−x MnxSe

Published online by Cambridge University Press:  26 February 2011

B. A. Bunker ,
W.-F. Pong ,
U. Debska ,
D. R. Yoder-Short  and
J. K. Furdyna
B. A. Bunker
Affiliation:
University of Notre Dame, Dept. of Physics, Notre Dame, IN 46530
W.-F. Pong
Affiliation:
University of Notre Dame, Dept. of Physics, Notre Dame, IN 46530
U. Debska
Affiliation:
University of Notre Dame, Dept. of Physics, Notre Dame, IN 46530
D. R. Yoder-Short
Affiliation:
Purdue University, Dept. of Physics, West Lafayette, IN 47907.
J. K. Furdyna
Affiliation:
Purdue University, Dept. of Physics, West Lafayette, IN 47907.
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Abstract

EXAFS has been used to determine bond lengths in the diluted magnetic semiconductor Zn1−xMnxSe. These alloys change from a cubic (zincblende) crystal structure to a hexagonal (wurtzite) structure as a function of composition, with the transition at x ≈ 0.3. Although x-ray diffraction measurements show the lattice parameter to change by approximately 0.2Å through the series and the crystal structure changes from cubic to hexagonal, the nearestneighbor bond distances show no change within the experimental uncertainty of 0.0Å.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 89: Symposium Q – Diluted Magnetic (Semimagnetic) Semiconductors , 1986 , 231
Copyright
Copyright © Materials Research Society 1987

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References

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