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Estimation Of Complex Permittivity Of Printed Circuit Board Material Using Waveguide Measurements

Published online by Cambridge University Press:  10 February 2011

C. J. Reddy ,
M. D. Deshpande  and
G. A. Hanidu
C. J. Reddy
Affiliation:
Department of Electrical Engineering, Hampton University, Hampton VA 23668
M. D. Deshpande
Affiliation:
ViGYAN Inc., Hampton VA 23681
G. A. Hanidu
Affiliation:
Department of Electrical Engineering, Hampton University, Hampton VA 23668
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Abstract

A simple waveguide measurement technique is presented to determine the complex permittivity of printed circuit board material. The printed circuit board with metal coating removed from both sides and cut into size which is the same as the cross section of the waveguide is loaded in a short X-band rectangular waveguide. Using a network analyzer, the reflection coefficient of the shorted waveguide(loaded with the sample) is measured. Using the Finite Element Method(FEM) the exact reflection coefficient of the shorted wavguide(loaded with the sample) is determined as a function of dielectric constant. Matching the measured value of the reflection coefficient with the reflection value calculated using FEM and utilizing Newton-Raphson Method, an estimate of the dielectric constant of a printed circuit board material is obtained. A comparison of estimated values of permittivity constant obtained using the present approach with the available data.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 430: Symposium O – Microwave Processing of Materials V , 1996 , 301
Copyright
Copyright © Materials Research Society 1996

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