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Epitaxial thin films of ordered double perovskite SrLaVMoO6

Published online by Cambridge University Press:  12 July 2012

Katsutoshi. Sanbou ,
Keita. Sakuma ,
Tetsuya. Miyawaki ,
Kenji. Ueda  and
Hidefumi. Asano
Katsutoshi. Sanbou
Affiliation:
Dept. of Crystalline Materials Science, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan
Keita. Sakuma
Affiliation:
Dept. of Crystalline Materials Science, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan
Tetsuya. Miyawaki
Affiliation:
Dept. of Crystalline Materials Science, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan
Kenji. Ueda
Affiliation:
Dept. of Crystalline Materials Science, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan
Hidefumi. Asano
Affiliation:
Dept. of Crystalline Materials Science, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan
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Abstract

Epitaxial thin films of SrLaVMoO6 with an ordered double perovskite structure have been grown on (001) and (111) SrTiO3 substrates by magnetron sputtering. The optimized (111) film exhibited a clear (111) diffraction peak, which is a superlattice reflection of double perovskite unite cell, indicating clear B-site ordering. Temperature dependences of resistivity ρ show metallic behavior and transition point at 140~150 K, of which behavior is reminiscent of the electrical properties of materials showing long-range magnetic or antiferromagnetic order. XPS results of the Mo 3d core level spectra are discussed in terms of the B-site ordering and oxygen nonstoichiometry.

Keywords

thin filmoxidecrystal
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1454: Symposium HH – Nanocomposites, Nanostructures and Heterostructures of Correlated Oxide Systems , 2012 , pp. 21 - 26
Copyright
Copyright © Materials Research Society 2012

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References

REFERENCES

de Groot, R. A., Mueller, F. M., van Engen, P. G., and Buschow, K. H. J., Phys. Rev. Lett. 50, 2024 (1983).CrossRefGoogle Scholar
Pickett, W. E. and Moodera, J. S., Phys. Today 54, 39 (2001).CrossRefGoogle Scholar
van Leuken, H. and de Groot, R. A., Phys Rev. Lett. 74, 1171 (1995).CrossRefGoogle Scholar
Pickett, W. E., Phys. Rev. Lett. 77, 3185 (1996).CrossRefGoogle Scholar
Rudd, R. E., and Pickett, W. E., Phys. Rev. B 57, 357 (1998).CrossRefGoogle Scholar
Pickett, W. E., Phys. Rev. B 57, 10613 (1998).CrossRefGoogle Scholar
Park, J. H., Kwon, S. K., and Min, B. I., Phys. Rev. B 65, 174401 (2002).Google Scholar
Spaldin, N. A., and Pickett, W. E., J. Solid. State. Chem. 6176, 615 (2003).CrossRefGoogle Scholar
Park, M. S., and Min, B. I., Phys. Rev. B 71, 052405 (2005).Google Scholar
Wang, Y. K., and Guo, G. Y., Phys. Rev. B 73, 064424 (2006).CrossRefGoogle Scholar
Pardo, V. and Pickett, W. E., Phys. Rev. B 80, 054415 (2009).CrossRefGoogle Scholar
Uehara, M., Yamada, M., and Kimishima, Y., Solid State Commun. 129, 385 (2004).CrossRefGoogle Scholar
Gotoh, H., Takeda, Y., Asano, H., Zhong, J., Rajanikanth, A., and Hono, K.: Appl. Phys. Expr. 2, 013001 (2009)CrossRefGoogle Scholar
Asano, H., Gotoh, H., Matsushima, H., Takeda, Y., Zhong, J., Rajanikanth, A., and Hono, K., J. Phys.: Conf. Ser. 200, 052001 (2010).Google Scholar
Jana, S., Singh, V., Kaushik, S. D., Meneghini, C., Pal, P., Knut, R., Karis, O., Dasgupta, I., Siruguri, V., and Ray, S., Phys. Rev. B 82, 180407(R) (2010).CrossRefGoogle Scholar
Besse, M., Pailloux, F., Barthelemy, A., Bouzehouane, K., Fert, A., Olivier, J., Durand, O., Wyczisk, F., Bisaro, R., and Contour, J. P., J. Cryst. Growth, 78, 781 (2002)Google Scholar
Borges, R. P., Lhostis, S., Bari, M. A., Versluijs, J. J., Lunney, J. G., Coey, J. M. D., Besse, M., and Contour, J. P., Thin Solid Films, 429, 5 (2003).CrossRefGoogle Scholar
Matsushima, H., Gotoh, H., Miyawaki, T., Ueda, K. and Asano, H., J. Appl. Phys. 109, 07E321 (2011).CrossRefGoogle Scholar
Sarma, D. D., Mahadevan, P., Saha-Dasgupta, T., Ray, S. and Kumar, A., Phys. Rev. Lett. 85, 2549 (2000).CrossRefGoogle Scholar
Agata, S., Morimoto, Y., Machida, A., Kato, K. and Nakamura, A., Jpn. J. Appl. Phys. 41, pp. L688–L690 (2002).CrossRefGoogle Scholar