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Epitaxial Relationships of the a-Axis Oriented YBa2Cu3O7-x Thin Films on the PrBa2Cu3O7-xTx Buffered SrTiO3(100) by two Step PLD

Published online by Cambridge University Press:  15 February 2011

Gun Yong Sung
Affiliation:
Electronics and Telecommunications Research Institute, Yusong P.O.Box 106, Taejeon, 305-600, REP. OF KOREA
Jeong Dae Suh
Affiliation:
Electronics and Telecommunications Research Institute, Yusong P.O.Box 106, Taejeon, 305-600, REP. OF KOREA
Sahn Nahm
Affiliation:
Electronics and Telecommunications Research Institute, Yusong P.O.Box 106, Taejeon, 305-600, REP. OF KOREA
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Abstract

An a-axis oriented YBa2Cu3O7-x (YBCO) thin film exhibiting zero resistance at 83 K and critical current density of 7.9x103 A/cm2 at 62 K was obtained on an 180 nm - thick PrBa2Cu3 O7-xx(PBCO) buffered SrTiO3(100) substrate by two step pulsed laser deposition (PLD). The volume fraction of a-axis orientation and the crystallinity(Xmin) of the 150 nm-thick YBCO thin films were increased with increasing the thickness of PBCO buffer layer, which was varied friom 0 nm to 180 nm. It is concluded that the thickness of PBCO buffer layer is one of the important parameters to control the structural and superconducting properties of the a-axis oriented YBCO thin films using the PBCO buffer layers.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

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