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Enhancement of luminescence quantum yield of 1.5 µm emission from Er-doped SiO2 sensitized with Si nanocrystals

Published online by Cambridge University Press:  13 February 2014

S. Saeed
Affiliation:
Van der Waals – Zeeman Institute, University of Amsterdam, Science Park 904, 1098 XH Amsterdam, The Netherlands
T. Gregorkiewicz
Affiliation:
Van der Waals – Zeeman Institute, University of Amsterdam, Science Park 904, 1098 XH Amsterdam, The Netherlands
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Abstract

Excitation of multiple Er3+ ions upon absorption of a single high-energy photon increases Er-related emission at 1.5 μm, and therefore enhances UV/visible-to-IR photon conversion efficiency. Here we investigate this effect for layers of Er-doped SiO2 sensitized with silicon nanocrystals by measuring the quantum yield of 1.5 µm Er-related emission. We demonstrate dramatic increase of the emission commencing for excitation energies above a certain threshold value, as the number of Er3+ ions excited upon absorption of a single incoming photon increases. By comparing differently prepared materials, we show that the actual value of this threshold energy and the rate of the observed increase of the quantum yield depend on sample characteristics – the size of Si nanocrystals and the ratio of Er3+ ions and nanocrystals concentrations.

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Articles
Copyright
Copyright © Materials Research Society 2014 

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References

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