Hostname: page-component-77c89778f8-m42fx Total loading time: 0 Render date: 2024-07-17T18:17:50.999Z Has data issue: false hasContentIssue false
  • English
  • Français

Engineering Micrometer and Nanometer Scale Features in Polydimethylsiloxane Elastomers for Controlled Cell Function

Published online by Cambridge University Press:  17 March 2011

Adam W. Feinberg ,
Charles A. Seegert ,
Amy L. Gibson  and
Anthony B. Brennan
Adam W. Feinberg
Affiliation:
Biomedical Engineering Program, Univ of Florida, Gainesville, FL 32611-6400, U.S.A.
Charles A. Seegert
Affiliation:
Biomedical Engineering Program, Univ of Florida, Gainesville, FL 32611-6400, U.S.A.
Amy L. Gibson
Affiliation:
Dept of Materials Science and Engineering, Univ of Florida, Gainesville, FL 32611-6400, U.S.A.
Anthony B. Brennan
Affiliation:
Biomedical Engineering Program, Univ of Florida, Gainesville, FL 32611-6400, U.S.A. Dept of Materials Science and Engineering, Univ of Florida, Gainesville, FL 32611-6400, U.S.A.
Get access

Abstract

Cell movement, differentiation and metabolic function must be controlled in precise ways to produce both regenerated tissues such as bone and functional tissue equivalents such as immuno-isolated islet cells. Close examination of extracellular matrix (ECM) reveals structures on the micron and nanometer scale that are shown to influence these factors and therefore we hypothesize that cells will move based on topographical cues in the scaffold. We have engineered siloxane elastomer surfaces that mimic the ECM by combining micron and nanometer scale topographic features. Micron scale pillars and ridges ranging in height from 1.5 to 5 microns and separated by 5, 10 and 20 microns were fabricated in a silicon wafer using micro- processing techniques and replicated in polydimethylsiloxane (PDMS) elastomer. Nanometer scale pillars, ridges and more complex shapes ranging in height from 12 to 300 nanometers were superimposed on the micron scale features using nanolithography. This was achieved by using a tapping mode tip in the atomic force microscope (AFM) to plastically deform the substrate surface. The AFM enabled nano-features to be placed on sloped surfaces and added directly to the PDMS elastomer surface. Surface topography was examined using scanning electron microscopy, atomic force microscopy and white light interference profilometry to verify surface modifications and fidelity of the replication process. Results indicate that it is possible to create spatially engineered surface textures from 10-5 m to 10-8 m in size, in specified patterns, by using a combination of microprocessing and nanolithography techniques. As better understanding of ECM function and design is gained, the processing methods outlined here will assist in fabricating tissue engineering scaffolds optimized at the nanometer and micron scale.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 711: Symposia FF/GG/HH – Advanced Biomaterials--Characterization, Tissue Engineering and Complexity , 2001 , GG1.8.1
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Flemming, R.G., Murphy, C.J., Abrams, G.A., Goodman, S.L., Nealey, P.F., Biomaterials. 20, 573–588 (1999).Google Scholar
2. Wilkerson, W. R., Seegert, C. A., Feinberg, A. W., Zhao, L. C., Callow, J. A., Callow, M. E. and Brennan, A. B., Polymer Preprints. 42, 147–148 (2001).Google Scholar
3. Tsilimbaris, M. K., Lesniewska, E., Lydataki, S., Grimellec, C. Le, Goudonnet, J. P. and Pallikaris, I. G., Investigative Opthamology and Visual Science. 41, 680–686 (2000).Google Scholar
4. Abrams, G. A., Goodman, S. L., Nealey, P. F., Franco, M., and Murphy, C. J., Cell Tissue Res. 299, 39–46 (2000).Google Scholar
5. Mirkin, C. A., Hong, S. and Demers, L., Chemphyschem. 2, 37–39 (2001).Google Scholar
6. Heyde, M., Rademann, K., Cappella, B., Geuss, M., Sturm, H., Spangenberg, T. and Niehus, H., Review of Scientific Instruments. 72, 136–141 (2001).Google Scholar
7. Ishibashi, M., Heike, S. and Hashizume, T., Jpn. J. Appl. Phys. 39, 7060–7062 (2000).Google Scholar
8. Piner, R. D., Zhu, J., Xu, F., Hong, S. and Mirkin, C. A., Science. 283, 661–663 (1999).Google Scholar
9. Hong, S., Zhu, J. and Mirkin, C. A., Science. 286, 523–525 (1999).Google Scholar
10. Wilder, K., et al., Applied Physics Letters. 73, 2527–2529 (1998).Google Scholar
11. Okazaki, A., Kishida, T., Akita, S., Nishijima, H. and Nakayama, Y., Jpn. J. Appl. Phys. 39, 7067–7069 (2000).Google Scholar
12. Feinberg, A. W., Seegert, C. A., Wilkerson, W. R., Gibson, A., Wilson, L., Baney, R. and Brennan, A. B., Polymer Preprints. 42, 151–152 (2001).Google Scholar