Hostname: page-component-848d4c4894-8kt4b Total loading time: 0 Render date: 2024-06-23T06:34:31.379Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron Microscopy of Interfaces in Silicon Carbide Whisker-Reinforced Alumina Composites

Published online by Cambridge University Press:  21 February 2011

K. B. Alexander ,
P. Angelini  and
P. F. Becher
K. B. Alexander
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, P. O. Box 2008, Oak Ridge, TN 37831
P. Angelini
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, P. O. Box 2008, Oak Ridge, TN 37831
P. F. Becher
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, P. O. Box 2008, Oak Ridge, TN 37831
Get access

Abstract

Knowledge about the nature of interfaces between SiC whiskers and alumina matrices is critical to understanding the mechanical behavior of these types of composites. The fracture toughness, in particular, is strongly influenced by the bond characteristics of this interface. Previous results have shown that oxidizing the whiskers in air prior to composite fabrication by vacuum hot-pressing results in composites which have lower toughness compared to those made with whiskers in the as-received condition. This investigation focusses on the effects of oxidizing and reducing surface treatments on the whiskers themselves and on the whisker-matrix interface. High resolution electron microscopy (HREM) was used to characterize the morphology and the amount of amorphous phase at the whisker-matrix interface, as well as the crystallography and topography of the interface. The present results indicate that the characteristics of the whisker/matrix interface may not be directly related to the initial whisker surface chemistry. Surprisingly, the thickest thermally-grown oxide layer resulted in the thinnest amorphous film at the SiC/Al2O3 interface.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 183: Symposium E – High Resolution Electron Microscopy of Defects in Materials , 1990 , 273
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Becher, P. F. and Wei, G. C., Comm. Am. Ceram. Soc., 67 (12), 259 (1984).10.1111/j.1151-2916.1984.tb19694.xGoogle Scholar
2. Becher, P. F., Hsueh, C. H., Angelini, P. and Tiegs, T. N., J. Am. Ceram. Soc., 71 (12), 1050 (1988).Google Scholar
3. Tiegs, T. N. and Becher, P. F., in Tailoring of Multiphase and Composite Ceramics, edited by Tressler, R., Messing, G., Pantano, C. and Newnham, R. (Plenum Publishing Corp., New York, 1986), p. 639.Google Scholar
4. Abuhasan, A. and Predecki, P., Adv. in Xray Analysis, 32, 471 (1989).Google Scholar
5. Allard, L. F., Nolan, T. A. and Rawlins, M. H., presented at the 1989 MRS Fall Meeting, Boston, MA, 1989 (unpublished).Google Scholar
6. Tiegs, T. N., Becher, P. F. and Harris, L. A. in Ceramic Microstructure ' 86: Role of Interfaces., (Plenum Press, New York, 1987) p. 911.10.1007/978-1-4613-1933-7_90Google Scholar
7. Homeny, J., Vaughn, W. L. and Ferber, M. K., J. Am. Ceram. Soc., 73 (2), 394 (1989).Google Scholar
8. Tiegs, T., Harris, L. A. and Geer, J. W., Oak Ridge National Laboratory Report, ORNL TM/10469 (1987).Google Scholar
9. Barrett, R. and Page, T. F., Ceram. Eng. Sci. Proc., 10 (7–8), 897 (1989).Google Scholar