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Electrochemical Behavior of Copper in Tetramethyl Ammonium Hydroxide Based Solutions

Published online by Cambridge University Press:  10 February 2011

W. H. Huang
Affiliation:
Dept of Material Science and Engineering, University of Arizona, Tucson, AZ
S. Raghavan
Affiliation:
Dept of Material Science and Engineering, University of Arizona, Tucson, AZ
Y. Fang
Affiliation:
Dept of Material Science and Engineering, University of Arizona, Tucson, AZ
L. Zhang
Affiliation:
Now with VLSI Technology, San Jose, CA
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Abstract

An investigation was undertaken to characterize the electrochemical behavior of copper in tetramethyl ammonium hydroxide (TMAH) based solutions. The effect of hydrogen peroxide and abrasion with a polyvinyl alcohol (PVA) brush on the corrosion of copper in alkaline solutions were characterized. Galvanic interactions between copper and tantalum in TMAH as well as in ammonium hydroxide (NH4OH) solutions were investigated. The experimental results have shown that the corrosion of copper in TMAH is lower than that in NH4OH, especially at pH values higher than 10. Even in the presence of hydrogen peroxide, TMAH corrodes copper at a lower rate than NH4OH.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

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References

REFERENCES

1. Hymes, D., Li, H., Zhao, E., and de Lario, J., Semiconductor International, p. 117122 (June 1998).Google Scholar
2. Cady, W. A. and Varadarajan, M., J. Electrochem. Soc., 143, p. 20642067 (1996).10.1149/1.1836950Google Scholar
3. Jolley, M., Solid State Phenomena, 65–66, p. 105108 (1999).Google Scholar
4. Stem, M. and Geary, A., J. Electrochem. Soc., 104, 56(1957).Google Scholar
5. Kneer, E. A., Raghunath, C., Mathew, V., Raghavan, S., and Jeon, J. S., J. Electrochem. Soc., 144, p. 30413049 (1997).10.1149/1.1837956Google Scholar