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Electrical Characterization of Low Dielectric Constant LCP Composite Films

Published online by Cambridge University Press:  15 February 2011

L. M. Walpita ,
G. Lundberg  and
J. Stamatoff
L. M. Walpita
Affiliation:
Hoechst Celanese Corporation, Research Division, 86 Morris Avenue, Summit, NJ 07901
G. Lundberg
Affiliation:
Hoechst Celanese Corporation, Research Division, 86 Morris Avenue, Summit, NJ 07901
J. Stamatoff
Affiliation:
Hoechst Celanese Corporation, Research Division, 86 Morris Avenue, Summit, NJ 07901
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Abstract

A variety of low dielectric constant composites have been made into films and characterized. These composites were blends of liquid crystalline polymers (LCPs), hollow glass spheres (HGS) and polytetrafluoroethylene (PTFE). By adjusting the percentage compositions of the various components of the composites, the dielectric constant could be adjusted in the range 2.4 to 3.4. Measurement of the dielectric constant by Time Domain Reflectometry (TDR) and Frequency Domain Reflectometry (FDR) are discussed. Dielectric anisotropy is also discussed. The experimentally observed results are compared with those derived theoretically.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 323: Symposium J – Electronic Packaging Materials Science VII , 1993 , 289
Copyright
Copyright © Materials Research Society 1994

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References

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