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Effects of Sulfur Concentration on the Electron Field Emission Properties of Nanocrystalline Carbon Thin Films

Published online by Cambridge University Press:  21 March 2011

S. Gupta ,
B. R. Weiner ,
B. L. Weiss  and
G. Morell
S. Gupta
Affiliation:
Department of Physics, University of Puerto Rico, San Juan, PO Box 23343, PR00931, USA
B. R. Weiner
Affiliation:
Department of Chemistry, University of Puerto Rico, San Juan, PO Box 23346, PR00931, USA
B. L. Weiss
Affiliation:
Department of Physics, University of Puerto Rico, San Juan, PO Box 23343, PR00931, USA
G. Morell
Affiliation:
Department of Physical Sciences, University of Puerto Rico, San Juan, PO Box 23323, PR00931, USA
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Abstract

The electron field emission properties of sulfur-assisted nanocrystalline carbon (n-C: S) thin films grown on molybdenum substrates by hot-filament CVD technique using methane-hydrogen (CH4/H2) and hydrogen sulfide-hydrogen (H2S/H2) gas mixtures were investigated. The field emission properties of the S-assisted films are reported as a function of sulfur concentration. The incorporation of S caused structural and microstructural changes that were characterized with SEM, AFM and Raman spectroscopy (RS). The S-assisted films show smoother surfaces and smaller grains than those grown without. The lowest turn-on field measured was around 4.5 – 5.0 V/μm films grown with 500 ppm of hydrogen sulfide and at 900 °C. The electron field emission properties of S-assisted films were also compared to those grown without sulfur (i.e., intrinsic). An inverse correlation between the threshold field (Ec) and sulfur concentration was found. These finding are attributed to defect induced states within the electronic band structure.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 675: Symposium W – Nanotubes, Fullerenes, Nanostructured and Disordered Carbon , 2001 , W6.9.1
Copyright
Copyright © Materials Research Society 2001

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References

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