Hostname: page-component-848d4c4894-cjp7w Total loading time: 0 Render date: 2024-07-03T06:41:20.110Z Has data issue: false hasContentIssue false

Effects of MeV Ions on Thermal Stability of Single Walled Carbon Nanotubes

Published online by Cambridge University Press:  26 February 2011

Ananta Raj Adhikari
Affiliation:
aa8381@albany.edu, State University of New York at Albany, College of Nanoscale Science and Engineering, 251 Fuller Road, Albany, NY, 12203, United States, 518-322-5372
Mengbing Huang
Affiliation:
mhuang@uamail.albany.edu, United States
Chang Ryu
Affiliation:
ryuc@rpi.edu, United States
Pullickel Ajayan
Affiliation:
ajayan@rpi.edu, United States
Hassaram Bakhru
Affiliation:
HBakhru@uamail.albany.edu, United States
Get access

Abstract

The properties of carbon nanotubes (CNTs) are closely dependent on their structures, and therefore may be tailored by controllably introducing defects in the nanotube systems. In this work, we have investigated the effects of energetic ions (H+ and He+) on the thermal stability of single wall nanotubes (SWNTs) against oxidation in air. SWNTs were irradiated with MeV ions to various doses in the range 1013-1016 cm−2. Thermogravimetric analysis (TGA) was used to determine the loss of CNT masses as a result of oxidation processes. As opposed to the case of pristine SWNTs for which the temperature (Tmax) corresponding to maximum oxidation rate was found to be ∼ 495 °C, ion beam processing significantly enhanced the thermal stability of nanotubes, e.g., Tmax increased by about 30 °C after H+ implantation (dosage: 1015 cm−2) and 17 °C after He+ implantation (dosage: 1013 cm−2). The activation energies for thermal oxidation under various conditions were also extracted from TGA data, with values ranging from 1.13 eV (for pristine SWNTs) to 1.37 eV, depending on ion doses and species. Raman spectroscopy was used to determine the characteristics of the G band (C-C stretching mode) and D band (disorder induced mode) in CNTs. The work suggests that the SWNTs modifies to more stable structure (may be cross-linked SWNTs) at small doses. Once the number of defects exceeds some critical value (depending on the type and dosage of bombarding ion) the bonding energy in CNTs weakens, leading to the reduced thermal stability of CNTs against oxidation.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Iijima, S., Ichihashi, T., Nature 363, 603 (1993).Google Scholar
2 Collins, P. G., Zettl, A., Bando, H., Thess, A. and Smalley, R. E., Science 278, 100 (1997).Google Scholar
3 Wong, E. W., Sheehan, P. E. and Liber, C. M., Science 277, 1971 (1997).Google Scholar
4 Chen, P., Wu, X., Lin, J. and Tan, K., Science 285, 91 (1999).Google Scholar
5 Dresselhaus, M. S., Dresselhaus, G., Avouris, P., Carbon Nanotubes, Vol. 80 (Springer-Verlag, Heidelgurg, 2001).Google Scholar
6 Lahr, B., Sandler, J., Kunstsoffe 90, 94 (2000).Google Scholar
7 Krashminnikov, A. V. and Nordlund, K., J. Vac. Sci. Technol. B 20, 728 (2002).Google Scholar
8 Kotakoski, J., Krasheninnikov, A. V., Ma, Y., Foster, A. S., Phys. Rev. B 71, 205408 (2005).Google Scholar
9 Bockrath, M., Liang, W., Bozovic, D., Hafner, J. H., Liber, C. M., Tinkham, M. and Park, H., Science 291, 283 (2001).Google Scholar
10 Broido, A., J. Polym. Sci. 7, 1762 (1969).Google Scholar
11 Chu, X. and Schmidt, L. D., Carbon 29, 1251 (1991).Google Scholar
12 Mckee, D. W. and Spiro, C. L., Carbon 23, 437 (1985).Google Scholar
13 Dresselhaus, M S, Dresselhaus, G, Eklund, P C 1996 Science of Fullerenes and Carbon Nanotubes, Academic Press, San Diego Google Scholar
14 Tuinstra, F. and Koening, J. L., J. Chem. Phys. 53, 1126 (1970).Google Scholar
15 Salonen, E., Krasheninnikov, A.V. and Nordlund, K., Nucl. Instr. and Meth. B 193, 603 (2002).Google Scholar
16 Lopez, M. J., Rubio, A., Alonso, J. A., Lefrant, S., Metenier, K. and Bonnamy, S., Phys. Rev. Lett. 89, 255501 (2002).Google Scholar
17 Bom, D., Andrews, R., Jacques, D., Anthony, J., Chen, B., Meier, M. S. and Seleque, J. P., Nano Lett. 6, 615 (2002).Google Scholar
18 El-Barbary, A. A., Telling, R. H., Ewels, C. P., Heggie, M. I. and Briddon, P. R., Phys. Rev. B 68, 144107 (2003).Google Scholar