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Effect of Substrate on the Early Stages of the Growth of YBa2Cu3O7-δ Thin-Films

Published online by Cambridge University Press:  16 February 2011

M. Grant Norton
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853.
C. Barry Carter
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY 14853.
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Abstract

The fabrication of high-quality thin-films often depends on the early stages of the growth process during which epitaxy is established. The substrate structure and orientation generally play a critical role at this stage through epitaxy and interaction or reaction. Many different materials are being used as substrates to support thin-films of the YBa2Cu3O7-δ superconductors. In this study the early stages of the growth of YBa2Cu3O7-δ thin-films have been investigated using transmission electron microscopy (TEM). Using pulsed-laser ablation, ultra-thin films were formed directly onto self-supporting, ion-thinned, single-crystal ceramic substrates. The substrates used were (001)-oriented MgO, (001)-oriented SrTiO3 and (001)-oriented LaAlO3.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

1. Russek, S.E., Moeckly, B.H., Buhrman, R.A., McWhirter, J.T., Sievers, A.J., Norton, M.G., Tietz, L.A. and Carter, C.B., Mat. Res. Soc. Symp. Proc. 169 (1989) (in press).Google Scholar
2. Venkatesan, T., Wu, X.D., Dutta, B., Inam, A., Hedge, M.S., Hwang, D.M., Chang, C.C., Nazar, L. and Wilkens, B., Appl. Phys. Lett. 54, 581 (1989).Google Scholar
3. Singh, R.K., Narayan, J., Singh, A.K. and Krishnaswamy, J., Appl. Phys. Lett. 54, 2271 (1989).Google Scholar
4. Koren, G., Gupta, A., Giess, E.A., Sergmuller, A. and Laibowitz, R.B., Appl. Phys. Lett. 54, 1054 (1989).Google Scholar
5. Simon, R.W., Platt, C.E., Lee, A.E., Lee, G.S., Daly, K.P., Wire, M.S., Luine, J.A. and Urbanik, M., Appl. Phys. Lett. 53, 2677 (1988).Google Scholar
6. Nuss, M.C., Mankiewich, P.M., Howard, R.E., Straughn, B.L., Harvey, T.E., Brandle, C.D., Berkstrasser, G.W., Gossen, K.W. and Smith, P.R., Appl. Phys. Lett, 54, 2265 (1989).Google Scholar
7. Moeckly, B.H., Lathrop, D.K., Redinbo, G.F., Russek, S.E. and Buhrman, R.A.. Mat. Res. Soc. Symp. Proc. 169 (1989) (in press).Google Scholar
8. Norton, M.G., Tietz, L.A., Sumnmerfelt, S.R. and Carter, C.B., Appl. Phys. Lett. 55, 2348 (1989).Google Scholar
9. Norton, M.G., Summerfelt, S.R. and Carter, C.B., Appl. Phys. Lett. (1990) (in press).Google Scholar
10. Tasker, P.W., Adv. Ceram. 10, 176 (1984).Google Scholar
11. Norton, M.G., Tietz, L.A., Summerfelt, S.R. and Carter, C.B., Mat. Res. Soc. Symp. Proc. 169 (1989) (in press).Google Scholar
12. Norton, M.G., McKernan, S. and Carter, C.B., Philos. Mag. Lett (1990) (submitted for publication).Google Scholar
13. Russek, S.E., PhD thesis, Cornell University (1989).Google Scholar
14. Norton, M.G. and Carter, C.B. (unpublished).Google Scholar
15. Hirsch, P.B., Howie, A., Nicholson, R.B., Pashley, D.W. and Whelan, M.J., Electron Microscopy of Thin Crystals (Kreiger, Malabar 1977) pp 357365.Google Scholar