Hostname: page-component-76fb5796d-vvkck Total loading time: 0 Render date: 2024-04-26T04:27:28.415Z Has data issue: false hasContentIssue false
  • English
  • Français

Effect of Long Range Interaction on Diffusion in Cu/NiFe TernaryAlloy Composition Modulated Thin Films

Published online by Cambridge University Press:  26 February 2011

Jharna Chaudhuri  and
Thomas Tsakalakos
Jharna Chaudhuri
Affiliation:
Mechanical Engineering Department., Wichita State Univ., Wichita, KS 67208
Thomas Tsakalakos
Affiliation:
Dept. of Mechanics and Materials Science, College of Engineering, Rutgers, The State University of New Jersey, Piscataway, NJ 08854
Get access

Abstract

Composition modulated (with wavelengths between 1.6 to 4.98 nm) Cu/NiFe ternary alloy thin films containing 53 at % Cu, 40 at % Ni, and 7 at % Fe were prdduced by the vapor-phase growth technique. The inter-diffusivities in these films were measured at temperatures 320°C, 345°C, and 400°C from the growth or decay rate of satelite peak intensities. as a function of dispersion relation B2 exhibited anomalous behavior at certain wavelengths at which an enhanced elastic modulus effect is also observed. This anomalous behavior was directly attributed to the long range interaction.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 37: Symposium D – Layered Structures, Epitaxy, and Interfaces , 1984 , 537
Copyright
Copyright © Materials Research Society 1985

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Dumond, J. and Youtz, J.P., J. Appl. Phys., 11, 357 (1940).10.1063/1.1712784Google Scholar
2. Dinklage, J. and Frerichs, R., J. Appl. Phys., 34, 2633(1963)CrossRefGoogle Scholar
3. rook, H.E. and Hillard, J.F., J. Appl. Phys., 40, 17–7 (1964)Google Scholar
4. Philofsky, E.M. and Hilliard, J.E., J. Appl. Phys., 55Google Scholar
5. Hillert, M., Acta. Metall., 9, 525 (1961).CrossRefGoogle Scholar
6. Cahn, J.W., Acta. Metall., 9, 795 (1961).CrossRefGoogle Scholar
7. Cook, H.E., DeFontaine, D. and Hilliard, J.E., Acta. Metall., 17, 915 (1969).CrossRefGoogle Scholar
8. Yamauchi, H., Ph.D. Thesis, Northeastern Univ. (1973).Google Scholar
9. Khachaturyan, A.G., Prog. Mat. Sci., 22 (1978).CrossRefGoogle Scholar
10. Tsakalakos, T. and Hilliard, J.E., J. Appl. Physics, 55 (8), 2885 (1984).Google Scholar
11. Tsakalakos, T., Thin Solid Films, 86, 79–90 (1981).Google Scholar
12. Jankowski, A., Ph.D. Thesis, Rutgers University (1984).Google Scholar
13. Ahn, S., Ph.D. Thesis, Rutgers University (1984).Google Scholar
14. Tsakalakos, T., Ph.D. Thesis, Northwestern University (1977).Google Scholar
15. Rundman, K.B. and Hilliard, J.E., Acta. Met. 15, 1025 (1967).CrossRefGoogle Scholar
16. Reynolds, J.E., Averbach, B.L. and Cohen, M. with an appendix by Hilliard, J.E., Acta. Metall., 5, 59 (1957).CrossRefGoogle Scholar
17. Wachtel, G.W.E., Frahauf, B. and Predel, B.. Phase Transformation in Solids, MRS Symposium Proceedings. North-Holland, 21, 461 (1984).Google Scholar