Hostname: page-component-76fb5796d-dfsvx Total loading time: 0 Render date: 2024-04-27T00:30:03.144Z Has data issue: false hasContentIssue false
  • English
  • Français

Effect of γ-Irradiation on Photoluminescence of Porous Silicon

Published online by Cambridge University Press:  15 February 2011

E. V. Astrova ,
V. V. Emtsev ,
A. A. Lebedev ,
D. S. Poloskin ,
A. D. Remenyuk ,
Yu. V. Rud'  and
R. F. Vitman
E. V. Astrova
Affiliation:
A. F. Ioffe Physicotechnical Institute, Polytechnicheskaya 26, 194021 St.Petersburg, Russia, mega@pulse. pti.spb.su
V. V. Emtsev
Affiliation:
A. F. Ioffe Physicotechnical Institute, Polytechnicheskaya 26, 194021 St.Petersburg, Russia, mega@pulse. pti.spb.su
A. A. Lebedev
Affiliation:
A. F. Ioffe Physicotechnical Institute, Polytechnicheskaya 26, 194021 St.Petersburg, Russia, mega@pulse. pti.spb.su
D. S. Poloskin
Affiliation:
A. F. Ioffe Physicotechnical Institute, Polytechnicheskaya 26, 194021 St.Petersburg, Russia, mega@pulse. pti.spb.su
A. D. Remenyuk
Affiliation:
A. F. Ioffe Physicotechnical Institute, Polytechnicheskaya 26, 194021 St.Petersburg, Russia, mega@pulse. pti.spb.su
Yu. V. Rud'
Affiliation:
A. F. Ioffe Physicotechnical Institute, Polytechnicheskaya 26, 194021 St.Petersburg, Russia, mega@pulse. pti.spb.su
R. F. Vitman
Affiliation:
A. F. Ioffe Physicotechnical Institute, Polytechnicheskaya 26, 194021 St.Petersburg, Russia, mega@pulse. pti.spb.su
Get access

Abstract

Properties of Porous Silicon (PS) subjected to gamma irradiation in an air ambient and in vacuum have been studied. Gamma-irradiation was carried out in usual room atmosphere, and in evacuated tubes. The samples of porous silicon were investigated by means of photoluminescence (PL) and infrared (IR) absorption. For the samples irradiated under atmospheric conditions, the PL intensity increases by several times as the dose increases up to 1019photons/cm2 and after that point it starts to go down. For a dose of ˜9.1019photons/cm2 the PL intensity falls by a factor of ˜50. The position of the spectrum maximum does not change, but the half-width of the spectrum increases by 2 or 3 times. In the case of gamma-irradiation in vacuum the PL intensity gradually decreases with increasing dose. IR absorption measurements showed variations of the intensity of Si-H and Si-O bands with the irradiation dose. Enhancement of PL at lower doses has been explained by irradiation assisted oxidation of PS at atmospheric conditions and its degradation at higher doses by suppresion of the light-emitting centers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 405: Symposium K – Surface/Interface and Stress Effects in Electronic Materials Nanostructures , 1995 , 185
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Canham, L. T., Appl.Phys.Lett. 57, 1046 (1991).Google Scholar
2. Fuchs, H. D., Stutzmann, M., Brandt, M. S., Rosenbauer, M., Weber, J., Breitschwerdt, A., Deak, P., and Cardona, M., Phys.Rev. B48, 8172 (1993).Google Scholar
3. Kux, A., Kovalev, D., Koch, F., Appl.Phys.Lett. 66, 49 (1995).Google Scholar
4. Tsai, C.,Li, K.-H., Kinosky, D. S., Qian, R.-Z., Hsu, T.-C., Irby, J. T., Banerjee, S. K., Tasch, A. F., Campbell, Joe C., Appl.Phys.Lett. 60, 1700 (1992).Google Scholar
5. Prokes, S. M., Appl. Phys. Lett. 62, 3244 (1993).Google Scholar
6. Fu, J. C., Mao, J. C., Wu, E., Yia, J. Q., Zhang, B. R., Zhang, L. Z., Qin, G. G., Wui, G. S., and Zhang, J. H., Appl.Phys.Lett. 63, 1830 (1993).Google Scholar
7. Astrova, E. V., Emtsev, V. V., Lebedev, A. A., Poloskin, D. S., Remenyuk, A. D., Rud', Yu. V., and Hartsiev, V. E., Semiconductors, 29, 674 (1995).Google Scholar
8. Bellami, L., Advances in infrared group frequencies, Methuen and Co Ltd, Bungay, Suffolk, 1968.Google Scholar
9. Nakamoto, K., Infrared spectra of inorganic and coordination compounds, John Wiley and Sons Inc., N.Y., London, 1990.Google Scholar
10. Rao, C. N. R., Chemical application of lR spectroscopy, Academic Press, New York, 1963.Google Scholar
11. Beckmann, H., Surface Science 3, 314 (1965).Google Scholar