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The Effect of Interfacial Free Energies on the Stability of Microlaminates

Published online by Cambridge University Press:  21 March 2011

A. C. Lewis ,
A. B. Mann ,
D. van Heerden ,
D. Josell  and
T. P. Weihs
A. C. Lewis
Affiliation:
Dept. of Materials Science & Engineering, The Johns Hopkins University, Baltimore, MD, USA
A. B. Mann
Affiliation:
Dept. of Materials Science & Engineering, The Johns Hopkins University, Baltimore, MD, USA Currently atUniversity of Manchester and UMIST, Manchester, UK
D. van Heerden
Affiliation:
Dept. of Materials Science & Engineering, The Johns Hopkins University, Baltimore, MD, USA
D. Josell
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, USA
T. P. Weihs
Affiliation:
Dept. of Materials Science & Engineering, The Johns Hopkins University, Baltimore, MD, USA
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Abstract

Laminated composites with polycrystalline layers typically break down at high temperatures through grain boundary grooving and the pinch-off of individual layers. Such materials, when exposed to high temperatures, develop grooves where grain boundaries meet the interfaces between layers. The depths of the grooves are controlled by the ratios of grain boundary and interfacial free energies, γgb/γint. Depending on the dimensions of the grains, these grooves can extend through the entire layer, causing pinch-off at the grain boundary. This pinch-off destroys the layering and eventually leads to a gross coarsening of the microstructure. Because microstructural stability is critical to performance for most applications, the ability to understand and predict the stability of microlaminates is a necessary tool. An existing model of this capillarity-driven breakdown requires the interfacial free energies, γgb and γint, as input parameters. Both biaxial and uniaxial zero creep tests have been used in conjunction with transmission electron microscopy to measure these interfacial energies in Ag/Ni and Nb/Nb5Si3 microlaminates.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 652: Symposium Y – Influences of Interface & Dislocation Behavior on Microstructure Evolution , 2000 , Y1.3
Copyright
Copyright © Materials Research Society 2001

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References

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