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Diffraction from Zeolites Containing Planar Faults

Published online by Cambridge University Press:  28 February 2011

M. M. J. Treacy ,
J. M. Newsam  and
M. W. Deem
M. M. J. Treacy
Affiliation:
Exxon Research and Engineering Company, Route 22 East, Annandale, NJ 08801
J. M. Newsam
Affiliation:
Exxon Research and Engineering Company, Route 22 East, Annandale, NJ 08801
M. W. Deem
Affiliation:
Exxon Research and Engineering Company, Route 22 East, Annandale, NJ 08801
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Abstract

Methods suitable for measuring the extent of planar faulting in the framework structures of zeolites are considered. A simple method is outlined for simulating diffracted intensities from crystals containing coherent planar defects. The algorithm employed efficiently exploits the self-similar properties of extended faulting patterns. The simplicity of this recursion method makes it suitable for complex crystal structures such as those of zeolites, and its utility is illustrated by a study of faulting in zeolite beta. Powder diffraction pattern simulations, which are in excellent agreement with observed data, indicate a fault probability in the chiral zeolite beta stacking sequence of α ≈0.56.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 138: Symposium Q – Characterization of the Structure and Chemistry of Defects in Materials , 1988 , 497
Copyright
Copyright © Materials Research Society 1989

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