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Dielectric Constant and Hysteresis Loop Remanent Polarization from 100 Hz to 2 MHz for Thin Ferroelectric Films

Published online by Cambridge University Press:  25 February 2011

K. W. Bennett ,
P. S. Brody ,
B. J. Rod ,
L. P. Cook ,
P. K. Schenck  and
S. Dey
K. W. Bennett
Affiliation:
Harry Diamond Laboratories, Adelphi, MD 20783-1197
P. S. Brody
Affiliation:
Harry Diamond Laboratories, Adelphi, MD 20783-1197
B. J. Rod
Affiliation:
Harry Diamond Laboratories, Adelphi, MD 20783-1197
L. P. Cook
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899
P. K. Schenck
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899
S. Dey
Affiliation:
Arizona State University, Tempe, AZ 85287-6006
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Abstract

A modification of the standard Sawyer-Tower circuit method of displaying ferroelectric hysteresis allowed the technique to be extended to sinusoidal switching frequencies of 2 MHz. Using this method, probe station measurements of switched remanent polarization were made for two films: excimer-laser-deposited lead zirconate titanate (PZT) and sol-gel PZT. Switched remanent polarization and dielectric constant were measured as a function of frequency between 100 Hz and 2 MHz and as a function of elapsed switching cycles at the 1-MHz rate. Both films showed decreasing switched remanent polarization and dielectric constant with increasing frequencies. This effect is attributed to limitations in domain wall velocity.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 243: Symposium G – Ferroelectric Thin Films II , 1991 , 507
Copyright
Copyright © Materials Research Society 1992

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References

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