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Dielectric and Pyroelectric Characteristics of Plzt (9.5/65/35) Relaxor Thin Films

Published online by Cambridge University Press:  15 February 2011

K. K. Deb
K. K. Deb*
Affiliation:
U.S. Army Research Laboratory Infrared/Optics Technology Office, Fort Belvoir, VA 22060, kdeb@nvl.army.mil
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Abstract

Ferroelectric relaxor thin films of lead lanthanide zirconate titanate (PLZT) (9.5/ 65/35) have been deposited by the laser ablation technique onto metallized silicon and lanthanum aluminate substrates. The dielectric and pyroelectric properties of PLZT films and their temperature dependencies have been investigated in some detail in an evaluation of their potential as prospective pyroelectric infrared (IR) detector materials. The temperature at which the dielectric constant of a PLZT film reaches its peak is different from that for the peak pyroelectric coefficient. A lower dielectric constant at which the pyroelectric peak appears contributes to a high figure of merit for PLZT films, so that it is competitive with its ceramic counterpart, as well as with Pb(Mg1/3Nb2/3)O3 (PMN) relaxor ferroelectric ceramic.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 403: Symposium I – Polycrystalline Thin Films: Structure, Texture, Properties and Applications II , 1995 , 603
Copyright
Copyright © Materials Research Society 1996

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References

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