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CW Nd:YAG Laser Deposition of CdS Thin Films

Published online by Cambridge University Press:  25 February 2011

X. W. Wang
Affiliation:
Alfred University, Electrical Engineering Dept., Alfred, NY 14802
D. J. Finnigan
Affiliation:
Alfred University, Electrical Engineering Dept., Alfred, NY 14802
R. Noble
Affiliation:
Alfred University, Electrical Engineering Dept., Alfred, NY 14802
P. Mattocks
Affiliation:
SUNY at Fredonia, Physics Department, Fredonia, NY 14063
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Abstract

There are two phases of CdS, wurtzite (hexagonal) and zincblende (cubic). To the best of our knowledge there is no report on the growth of large single crystal cubic CdS. Although there have been reports on the vapor deposition of cubic dominated CdS thin films, physical measurements were limited. Substrate material has been considered as the primary factor in attaining the cubic dominated CdS thin films. We report new results on CW Nd:YAG laser deposition of CdS thin films at various temperatures. X-ray diffraction patterns show that the films deposited at 200°C have a dominant cubic phase, those at 400°C being hexagonal. Optical transmission measurements reveal room temperature absorption edges of 515nm and 500nm for films deposited at 200°C and 400°C, respectively. Transmission electron microscopy further reveals differences in crystal structure of the two films. Raman spectra of the cubic film is similar to that of the hexagonal film.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1. Witt, A., et. al., IEEE J. of Quantum Electron., 24, 2500 (1988).Google Scholar
2. Bouchenaki, C, et. al., J. Opt. Soc. Am. B, 8, 691 (1990).Google Scholar
3. Kawabe, U., Physica C, 153, 1586, (1988).Google Scholar
4. Traill, R. T., Boyle, R. W., Am. Mineralogist, 40 (7 & 8), 555, (1955).Google Scholar
5. Yeh, C. Y., et. al., Phys. Rev. B, 45 (20), 12130, (1992).Google Scholar
6. Kwok, H. S., et. al., Appl. Phys. Lett., 52 (13), 1095, March (1988).Google Scholar
7. Escoffery, C. A, J. Appl. Phys., 35, 2273, (1964).Google Scholar
8. Weinstein, M., et. al., Appl. Phys. Lett., 6 (4), 73, (1965).Google Scholar
9. Cardona, M., et. al., Phys. Rev., 140 (2A), 633 (1965).Google Scholar
10. CdS powder from Fisher Scientific, lot no. 73036. XRD indicated a dominant cubic phase, with a trace of hexagonal phase.Google Scholar
11. Wang, X.W., et al‥ to be published by SPIE - Soc. of Photo-optical Instrum. Eng., in “Integrated Optics and Microstructures”, Conference No. 1793, (SPIE, Berlingham, WA, 1992).Google Scholar
12. Scherrer, P., Nachr. Ges. Wiss. Gottingen, 98100, (1918).Google Scholar
13. Curves were fit using Split Pearson, separate exponents, with maximum errors of ±.003 degrees of two theta, for peaks corresponding to (111), (002), (222), (004) and ±.023 degrees for (103), (105).Google Scholar
14. Spitulnik, F., et. al., submitted to Materials Processing and Synthesis, (1992).Google Scholar
15. Correspond to <10.3>, and <10.5> indices of hexagonal.,+and+<10.5>+indices+of+hexagonal.>Google Scholar