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Critical behavior of Epitaxial Antiferromagnetic Insulator Films: Interdigital Capacitance Measurement of Magnetic Specific Heat

Published online by Cambridge University Press:  03 September 2012

M. Lui ,
A. R. King ,
V. Jaccarino  and
G. L. Snider
M. Lui
Affiliation:
Department of Physics, University of California, Santa Barbara, CA 93106
A. R. King
Affiliation:
Department of Physics, University of California, Santa Barbara, CA 93106
V. Jaccarino
Affiliation:
Department of Physics, University of California, Santa Barbara, CA 93106
G. L. Snider
Affiliation:
Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA 93106
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Abstract

An interdigital capacitance technique (ICT) for the measurement of magnetic specific heat (Cm) critical behavior of micron-thick epitaxial films of antiferromagnetic insulators (AF) has been developed. It was first applied to a study of high quality 3μm epitaxial films of FeF2 on lattice matching (001) oriented ZnF2 substrates. Under ideal preparatory conditions, the (Cm) results exhibit the divergent critical behavior of a 3-D Ising system. The ICT appears to be a useful method for characterizing the quality of AF films in regard to rms variations in the exchange interactions.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 151: Symposium G – Growth, Characterization and Properties of Ultrathin Magnetic Films and Multilayers , 1989 , 225
Copyright
Copyright © Materials Research Society 1989

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References

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