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Concentration of Hydrogen in Titanium Measured by Neutron Incoherent Scattering

Published online by Cambridge University Press:  10 February 2011

H. H. Chen-Mayer ,
D. F. R. Mildner ,
G. P. Lamaze ,
R. M. Lindstrom ,
R. L. Paul ,
V. V. Kvardakov  and
W. J. Richards
H. H. Chen-Mayer
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
D. F. R. Mildner
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
G. P. Lamaze
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
R. M. Lindstrom
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
R. L. Paul
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
V. V. Kvardakov
Affiliation:
Russian Research Center Kurchatov Institute, 123182, Moscow, Russia
W. J. Richards
Affiliation:
McClellan Air Force Base, CA 95652, USA
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Abstract

Mass fractions of hydrogen in titanium matrices have been measured using neutron incoherent scattering (NIS) and compared with results from prompt gamma activation analysis (PGAA). Qualitatively, NIS is a more efficient technique than PGAA which involves neutron absorption, and the former may be suitable for on-line analysis. However, for NIS the scattering contribution comes from both the hydrogen and the matrix, whereas prompt gamma emission has minimal matrix effect. To isolate the signal due to hydrogen scattering, a set of polypropylene films is used to simulate the increasing amount of hydrogen, and the scattered intensity is monitored. From this response, an unknown amount of the hydrogen can be deduced empirically. We have further attempted a first principle calculation of the intensity of the scattered signal from the experimental systems, and have obtained good agreement between calculation and the measurements. The study can be used as a reference for future applications of the scattering method to other hydrogen-in-metal systems.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 513: Symposium H – Hydrogen in Semiconductors and Metals , 1998 , 191
Copyright
Copyright © Materials Research Society 1998

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References

REFERENCES

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