Hostname: page-component-7bb8b95d7b-pwrkn Total loading time: 0 Render date: 2024-09-07T22:26:22.367Z Has data issue: false hasContentIssue false
  • English
  • Français

Comparison of Techniques for Microwave Characterization of Percolating Dielectric -Metallic Media and Resolution of Discrepancies in Measured Data

Published online by Cambridge University Press:  10 February 2011

Rick Moore ,
Lisa Lust ,
Edward Hopkins  and
Paul Friederich
Rick Moore
Affiliation:
Signature Technology Laboratory, Georgia Tech Research Institute, Georgia Institute of Technology, Atlanta, GA 30332, (rickv.moore@gtri.gatech.edu)
Lisa Lust
Affiliation:
Signature Technology Laboratory, Georgia Tech Research Institute, Georgia Institute of Technology, Atlanta, GA 30332, (rickv.moore@gtri.gatech.edu)
Edward Hopkins
Affiliation:
Signature Technology Laboratory, Georgia Tech Research Institute, Georgia Institute of Technology, Atlanta, GA 30332, (rickv.moore@gtri.gatech.edu)
Paul Friederich
Affiliation:
Signature Technology Laboratory, Georgia Tech Research Institute, Georgia Institute of Technology, Atlanta, GA 30332, (rickv.moore@gtri.gatech.edu)
Get access

Abstract

The measured microwave effective dielectric properties of metal-dielectric composites show discrepancies when data from free space, resonant cavity or transmission line measurements are compared. Discrepancies are especially evident for materials where the metallic concentration is near the percolation threshold. This paper presents theory and measured data which highlight and resolve these discrepancies. Electrical correlation length is the relevant parameter which must be considered in choice of measurement technique. Agreement between effective medium models and measurement are best when focussed beam measurement techniques are utilized so as to produce planar wave-fronts whose extent is 3–4 freespace wavelengths when incident on the sample.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 500: Symposium EE – Electrically Based Microstructural Characterization II , 1997 , 335
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Geyer, R., NIST Technical Note 1338, April 1990.Google Scholar
2. Weil, C., Janezic, M. and Vanzura, E., NIST Technical Note 1386, March 1997.Google Scholar
3. Clerc, J. P., Giraud, G., Laugier, J. M., and Luck, J. M., Advances in Physics, 1990, Vol 39., No. 3, 191–309.Google Scholar
4. Neimark, A. V., Sov. Phys. JETP, August 1990, Vol. 71, No. 2, 341–348.Google Scholar
5. Zhang, X.; Stroud, D., Physical Review B, Vol.52, no. 3, p. 2131–7Google Scholar
6. Sahimi, M., Applications of Percolation Theory. Taylor and Francis Ltd, 1994.Google Scholar
7. Kemper, P., Moore, R., Materials Research Soc. 1994 Symposium ProceedingsGoogle Scholar