Hostname: page-component-77c89778f8-5wvtr Total loading time: 0 Render date: 2024-07-17T13:39:37.289Z Has data issue: false hasContentIssue false
  • English
  • Français

Combined Atom-Probe and Electron Microscopy Characterization of Fine Scale Structures in Aged Primary Coolant Pipe Stainless Steel

Published online by Cambridge University Press:  26 February 2011

J. Bentley  and
M. K. Miller
J. Bentley
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831.
M. K. Miller
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831.
Get access

Abstract

The capabilities and complementary nature of atom probe field-ion microscopy (APFIM) and analytical electron microscopy (AEM) for the characterization of finescale microstructures are illustrated by examination of the changes that occur after long term thermal aging of cast CF 8 and CF 8M duplex stainless steels. In material aged at 300 or 400°C for up to 70,000 h, the ferrite had spinodally decomposed into a modulated fine-scaled interconnected network consisting of an iron-rich α′ phase and a chromium-enriched α phase with periodicities of between 2 and 9 nm. G-phase precipitates 2 to 10 nm in diameter were also observed in the ferrite at concentrations of more than 1021 m−3. The reported degradation in mechanical properties is most likely a consequence of the spinodal decomposition in the ferrite.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 82: Symposium I – Characterization of Defects in Materials , 1986 , 163
Copyright
Copyright © Materials Research Society 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Brenner, S.S. and Miller, M.K., J. Metals 35 (3), 54–63 (1983).Google Scholar
2. Williams, D.B., Practical Analytical Electron Microscopv in Materials Science, (Philips Electronic Instruments, Inc., Mahwah, NJ, 1984).Google Scholar
3. Chopra, O.K. and Chung, H.M., Nuclear, U.S. Regulatory Commission/Argonne National Laboratory Report No. NUREG/CR-4503 ANL-86-3, 1986.Google Scholar
4. Miller, M.K., Bentley, J., Brenner, S.S. and Spitznagel, J.A., J. de Physique C9, 385–390 (1984).Google Scholar
5. Miller, M.K., Bentley, J., Brenner, S.S. and Spitznagel, J.A., in Proc. 43rd Ann. Meetin2 Electron Microscony Society of America, ed. Bailey, G.W. (San Francisco Press, San Francisco, 1985), p. 326–327.Google Scholar
6. Bentley, J., Miller, M.K., Brenner, S.S. and Spitznagel, J.A., in Proc. 43rd Ann. Meeting Electron Microscopy Society of America, ed. Bailey, G.W. (San Francisco Press, San Francisco, 1985), p. 328–329.Google Scholar
7. Miller, M.K. and Bentley, J., J. de Physique C7, 239–244 (1986).Google Scholar
8. Miller, M.K., J. de Physique, C2, 493 (1986); C2, 499 (1986).Google Scholar
9. Zaluzec, N.J., in Introduction to Analytical Electron Microscopv, eds. Hren, J.J., Goldstein, J.I. and Joy, D.C. (Plenum Press, New York, 1979) pp. 121–167, Chapter 4.Google Scholar
10. Brenner, S.S., Miller, M.K. and Soffa, W.A., Scripta Met. 16, 831 (1982).Google Scholar