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Colour Characterisation of a-Si:H-Based Three-Terminal Three-Channel Detector

Published online by Cambridge University Press:  17 March 2011

Janez Krĉ ,
Marko Topiĉ ,
Franc Smole ,
Dietmar Knipp  and
Helmut Stiebig
Janez Krĉ
Affiliation:
Faculty of Electrical Engineering, University of Ljubljana, Slovenia
Marko Topiĉ
Affiliation:
Faculty of Electrical Engineering, University of Ljubljana, Slovenia
Franc Smole
Affiliation:
Faculty of Electrical Engineering, University of Ljubljana, Slovenia
Dietmar Knipp
Affiliation:
Institut für Photovoltaik, Forschungszentrum Jülich, Germany
Helmut Stiebig
Affiliation:
Institut für Photovoltaik, Forschungszentrum Jülich, Germany
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Abstract

Colour characterisation of a three-terminal three-channel colour detector in the assembly glass/TCO1/PI1NI2P/TCO2/PI3N/Al is performed, using a method of polynomial regression. The metameric errors of the detector calculated and investigated for different orders of polynomial colour correction are presented and discussed. The benefits of the first order colour correction are shown and graphically illustrated. The final transformation matrix for the first order colour correction and conversion to the output R, G and B signals is given. At the end, a demonstrational application with the a-Si:H-based detector and corresponding read-out and colour correction electronics is presented.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 609: Symposium A – Amorphous & Heterogeneous Silicon Thin Films – 2000 , 2000 , A12.5
Copyright
Copyright © Materials Research Society 2000

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References

REFERENCES

[1] Herzog, Patrick G., Knipp, Dietmar, Stiebig, Helmut and König, Friedhelm, SPIE Procs. Vol. 3648 (Electronic Imaging Conference, San Jose, USA), 1999, pp. 48–59 Google Scholar
[2] Knipp, D., Herzog, P.G., Stiebig, H., König, F., 18th ICAMS, Utah, USA, 1999, to be published in J. of Non-Cryst. Solids Google Scholar
[3] Topiĉ, M., Stiebig, H., Knipp, D., Smole, F., IEEE Trans. on Elec. Dev. 46 (1999) 1839–1845.Google Scholar
[4] Topiĉ, M., Smole, F., Furlan, J., Kusian, W., J. Non-Cryst. Solids 227–230 (1998) 1326–1329.Google Scholar
[5] http://www.colorpro.com/info/index.htmGoogle Scholar