Hostname: page-component-76fb5796d-r6qrq Total loading time: 0 Render date: 2024-04-26T23:35:33.159Z Has data issue: false hasContentIssue false

Chemical effects observed in the SERS spectra of single wall nanotubes

Published online by Cambridge University Press:  15 March 2011

Michaela Baibarac
Affiliation:
IMN-LPC, University of Nantes, Nantes, (France) National Institute of Materials Physics, Bucharest, (Romania)
Ioan Baltog
Affiliation:
IMN-LPC, University of Nantes, Nantes, (France) National Institute of Materials Physics, Bucharest, (Romania)
Serge Lefrant
Affiliation:
IMN-LPC, University of Nantes, Nantes, (France)
Olivier Chauvet
Affiliation:
IMN-LPC, University of Nantes, Nantes, (France)
Jean-Yves Mévellec
Affiliation:
IMN-LPC, University of Nantes, Nantes, (France)
Laetitia Vaccarini
Affiliation:
GDPC, University of Montpellier 2, Montpellier, (France)
Patrick Bernier
Affiliation:
GDPC, University of Montpellier 2, Montpellier, (France)
Get access

Abstract

In this paper, we present results obtained by Surface Enhanced Raman Scattering (SERS) on SWNTs films with different thicknesses. We show that the “D” band associated to disorder in graphitic compounds can also be due to intrinsic defects in SWNTs. In addition, we put in evidence strong interfacial reactions at the SWNTs/metallic support interface when NMP is used as solvent to disperse the tubes. Our observations suggest that these reactions can induce a breaking of the SWNTs. Presumably a reconstruction of compounds close to C60 molecules can occur.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Iijima, S., Nature (London) 354, 56 (1991).Google Scholar
2. Rao, A.M., Richter, E., Bandow, S., Chase, B., Ecklund, P.C., Williams, K.A., Fang, S., Subbbaswamy, K.R., M.Menon, Thess, A., Smalley, R.E., Dresselhaus, G., Dresselhaus, M.S., Science, 275, 187 (1987).Google Scholar
3. Rao, A.M., Bandow, S., Richter, E. and Eklund, P.C., Thin Solid Films 331, 141(1998).Google Scholar
4. Journet, C., Maser, W.K., Bernier, P., Loiseau, A., Chapelle, M. Lamy de la, Lefrant, S., Deniard, P., Lee, R., and Fischer, J.E., Nature(London) 388, 756 (1997).Google Scholar
5. Chapelle, M. Lamy de la, Lefrant, S., Journet, C., Maser, W.K., Bernier, P. and Loiseau, A., Carbon. 36, 705 (1999).Google Scholar
6. Henrard, L., Hernandez, E., Bernier, P. and Rubio, A., Phys. Rev. B, 60, R8521(1999).Google Scholar
7. Buisson, J.P., Chauvet, O., Lefrant, S., Stéphan, C., Benoit, J.M., these proceedings.Google Scholar
8. Duesberg, G.S., Loa, I., Burghard, M., Syassen, K. and Roth, S., Phys. Rev. Lett. 85, 5436 (2000).Google Scholar
9. Brown, S.D.M., Corio, P., Marucci, A., Dresselhaus, M.S., Pimenta, M.A., and Kneipp, K., Phys.Rev. 61, R5137 (2000).Google Scholar
10. Kneipp, K., Kneipp, H., Corio, P., Brown, S.D.M., Shafer, K., Motz, J., Perelman, L.T., Hanlon, E.B., Marucci, A., Dresselhaus, G. and Dresselhaus, M.S., Phys. Rev. Lett. 80, 3470 (2000).Google Scholar
11. Lefrant, S., Baltog, I., Chapelle, M. Lamy de la, Baibarac, M., Louarn, G., Journet, C., and Bernier, P., Synth. Met. 100, 13 (1999).Google Scholar
12. Stepanek, I. and Bernier, P., private communication.Google Scholar
13. Stéphan, C., Ph.D Thesis, 2000, unpublished results.Google Scholar