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A Chemical and Structural Study of the AlN-Si Interface

Published online by Cambridge University Press:  10 February 2011

R. Beye
Affiliation:
Center for Space Microelectronics Technology, Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA 91109
T. George
Affiliation:
Center for Space Microelectronics Technology, Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA 91109
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Abstract

Samples of AlN grown on silicon [111] substrates were examined using electron energy loss spectroscopy (EELS) and selected area diffraction (SAD) with high-resolution transmission electron microscopy (TEM) to determine the source of out-of-plane tilts and in-plane rotations of the AlN crystallites at the Si interface. SAD results indicate that the interfacial crystallites are sheared along vertical planes, with random, intercrystalline rotation. The interfacial phenomena are believed to be the result of Si-Al-N interaction. Analytical experiments show no evidence of silicon nitride formation, witnessed by nitrogen-K peak shape, up to the Si interface. No evidence of substrate-epilayer interdiffusion was observed. Chemical interaction within one monolayer of the interface is therefore suspected as the cause of the epilayer tilts and rotations.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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References

REFERENCES

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